The influence of the surface migration of gold on the growth of silicon nanowires von Hannon, J. B, Kodambaka, S, Ross, F. M, Tromp, R. M

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Thermodynamics and kinetics of graphene growth on SiC(0001) von Tromp, R M, Hannon, J B

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Dynamic microscopy of nanoscale cluster growth at the solid-liquid interface von Ross, F. M, Williamson, M. J, Tromp, R. M, Vereecken, P. M, Hull, R

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Atomic-scale transport in epitaxial graphene von Ji, Shuai-Hua, Hannon, J. B., Tromp, R. M., Perebeinos, V., Tersoff, J., Ross, F. M.

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Low-Energy Electron Irradiation Damage in Few-Monolayer Pentacene Films von Tebyani, A, Baalbergen, F. B, Tromp, R. M, van der Molen, S. J

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Growth dynamics of pentacene thin films von Meyer zu Heringdorf, Frank-J, Reuter, M. C, Tromp, R. M

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Transition States between Pyramids and Domes During Ge/Si Island Growth von Ross, F. M., Tromp, R. M., Reuter, M. C.

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Role of surface electronic structure in thin film molecular ordering von THAYER, G. E, SADOWSKI, J. T, MEYER ZU HERINGDORF, F, SAKURAI, T, TROMP, R. M

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Single-domain epitaxial silicene on diboride thin films von Fleurence, A., Gill, T. G., Friedlein, R., Sadowski, J. T., Aoyagi, K., Copel, M., Tromp, R. M., Hirjibehedin, C. F., Yamada-Takamura, Y.

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Nonuniversal Transverse Electron Mean Free Path through Few-layer Graphene von Geelen, D., Jobst, J., Krasovskii, E. E., van der Molen, S. J., Tromp, R. M.

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Novel Strategy for Diameter-Selective Separation and Functionalization of Single-Wall Carbon Nanotubes von Tromp, R. M, Afzali, A, Freitag, M, Mitzi, D. B, Chen, Zh

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Controlled synthesis and decoupling of monolayer graphene on SiC(0001) von Oida, S., Hannon, J. B., Tromp, R. M.

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Titration of submonolayer Au growth on Si(111) von Kautz, J., Copel, M. W., Gordon, M. S., Tromp, R. M., van der Molen, S. J.

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Shape transition in growth of strained islands : spontaneous formation of quantum wires von TERSOFF, J, TROMP, R. M

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A simple energy filter for low energy electron microscopy/photoelectron emission microscopy instruments von Tromp, R M, Fujikawa, Y, Hannon, J B, Ellis, A W, Berghaus, A, Schaff, O

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Measuring chromatic aberration in LEEM/PEEM von Tromp, R.M.

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Back Illuminated Photo Emission Electron Microscopy (BIPEEM) von Moradi, Amin, Rog, Matthijs, Stam, Guido, Tromp, R.M., van der Molen, S.J.

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Defocus in cathode lens instruments von Tromp, R.M., Altman, M.S.

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Nonuniversal Transverse Electron Mean Free Path through Few-layer Graphene von Geelen, D, Jobst, J, Krasovskii, E E, van der Molen, S J, Tromp, R M

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Measuring and correcting aberrations of a cathode objective lens von Tromp, R.M.

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