Baseline Exercise Tolerance and Perceived Dyspnea to Identify the Ideal Candidate to Pulmonary Rehabilitation: A Risk Chart in COPD Patients von Costi, Stefania, Crisafulli, Ernesto, Trianni, Ludovico, Beghè, Bianca, Faverzani, Silvia, Scopelliti, Giuseppe, Chetta, Alfredo, Clini, Enrico

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Utilization of the filter feeder polychaete Sabella von Giangrande, A, Cavallo, A, Licciano, M, Mola, E, Pierri, C, Trianni, L

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Tobacco Smoking Habits, Attitudes and Beliefs among Nurse and Medical Students in Tuscany von Melani, A. S., Verponziani, W., Boccoli, E., Trianni, G. L., Federici, A., Amerini, R., Vichi, M. G., Sestini, P.

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Activity and analysis of costs in a dedicated weaning centre von Clini, E M, Siddu, P, Trianni, L, Graziosi, R, Crisafulli, E, Nobile, M T

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Changes of Smoking Habits and Beliefs during Nurse Training: A Longitudinal Study von Boccoli, E., Federici, A., Trianni, G. L., Melani, A. S.

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Utilization of the filter feeder polychaete Sabella spallanzanii Gmelin (Sabellidae) as bioremediator in aquaculture von Giangrande, A, Cavallo, A, Licciano, M, Mola, E, Pierri, C, Trianni, L

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On a population of Sabella pavonina (Annelida Polychaeta) in Mar Grande of Taranto von Giangrande, A, Pierri, C, Trianni, L

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Chip attach frame von Trianni, Quintino L, Torreiter, Otto, Eckert, Martin

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Chip attach frame von Trianni Quintino L, Eckert Martin, Torreiter Otto

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CHIP ATTACH FRAME von Trianni Quintino L, Eckert Martin, Torreiter Otto

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Method for electrical testing of a 3-D chip stack von Torreiter, Otto A, Trianni, Quintino L, Kunigkeit, Eckhard, Eckert, Martin

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Module testing utilizing wafer probe test equipment von Trianni Quintino L, Zoellin Christian, Kunigkeit Eckhard, Eckert Martin

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Module testing utilizing wafer probe test equipment von Trianni Quintino L, Zoellin Christian, Kunigkeit Eckhard, Eckert Martin

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CHIP ATTACH FRAME von TORREITER OTTO, TRIANNI QUINTINO L, ECKERT MARTIN

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CHIP ATTACH FRAME von TORREITER OTTO, TRIANNI QUINTINO L, ECKERT MARTIN

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Module Testing Utilizing Wafer Probe Test Equipment von Trianni Quintino L, Zoellin Christian, Kunigkeit Eckhard, Eckert Martin

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Module Testing Utilizing Wafer Probe Test Equipment von Trianni Quintino L, Zoellin Christian, Kunigkeit Eckhard, Eckert Martin

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Soldering three dimensional integrated circuits von Torreiter Otto A, Trianni Quintino L, Kunigkeit Eckhard, Eckert Martin

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SOLDERING THREE DIMENSIONAL INTEGRATED CIRCUITS von Torreiter Otto A, Trianni Quintino L, Kunigkeit Eckhard, Eckert Martin

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SYSTEM FOR ELECTRICAL TESTING AND MANUFACTURING OF A 3-D CHIP STACK AND METHOD von KUNIGKEIT ECKHARD, TORREITER OTTO A, TRIANNI QUINTINO L, ECKERT MARTIN

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