Incidence and prognostic significance of newly-diagnosed atrial fibrillation among older U.S. veterans hospitalized with COVID-19 von Ko, Darae, Treu, Timothy M., Tarko, Laura, Ho, Yuk-Lam, Preis, Sarah R., Trinquart, Ludovic, Gagnon, David R., Monahan, Kevin M., Helm, Robert H., Orkaby, Ariela R., Lubitz, Steven A., Bosch, Nicholas A., Walkey, Allan J., Cho, Kelly, Wilson, Peter W. F., Benjamin, Emelia J.

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Sidestream dark field imaging: the evolution of real-time visualization of cutaneous microcirculation and its potential application in dermatology von Treu, Curt M, Lupi, Omar, Bottino, Daniel A, Bouskela, Eliete

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Antimicrobial susceptibilities of Austrian Francisella tularensis holarctica biovar II strains von Tomaso, Herbert, Al Dahouk, Sascha, Hofer, Erwin, Splettstoesser, Wolf D., Treu, Thomas M., Dierich, Manfred P., Neubauer, Heinrich

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Development of a 5'-Nuclease Real-Time PCR Assay Targeting fliP for the Rapid Identification of Burkholderia mallei in Clinical Samples von Tomaso, Herbert, Scholz, Holger C, Al Dahouk, Sascha, Eickhoff, Meike, Treu, Thomas M, Wernery, Renate, Wernery, Ulrich, Neubauer, Heinrich

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SiC JFET: Currently the Best Solution for an Unipolar SiC High Power Switch von Rueschenschmidt, Kathrin, Friedrichs, Peter, Treu, Michael, Peters, Dethard, Rupp, Roland, Elpelt, Rudolf, Blaschitz, Peter

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Seroprevalence of Anti-Yersinia Antibodies in Healthy Austrians von Tomaso, H., Mooseder, G., Dahouk, S. Al, Bartling, C., Scholz, H. C., Strauss, R., Treu, T. M., Neubauer, H.

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A New Generation of SiC Schottky Diodes with Improved Thermal Management and Reduced Capacitive Losses von Hilsenbeck, Jochen, Otremba, Ralf, Treu, Michael, Rupp, Roland, Holz, Matthias, Zeichen, Hannes, Björk, Fanny, Deboy, Gerald

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Temperature Dependence of Forward and Reverse Characteristics of Ti, W, Ta and Ni Schottky Diodes on 4H-SiC von Kapels, H., Rupp, Roland, Treu, Michael, Bartsch, Wolfgang

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Sustainable landscape planning for Cremona, Italy von Treu, M.C, Magoni, M, Steiner, F, Palazzo, D

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A Surge Current Stable and Avalanche Rugged SiC Merged pn Schottky Diode Blocking 600V Especially Suited for PFC Applications von Hilsenbeck, Jochen, Treu, Michael, Peters, Dethard, Reimann, T., Rupp, Roland, Elpelt, Rudolf, Brunner, Helmut, Tai, Chee Siew, Blaschitz, Peter

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Electro-Thermal SPICE Model for High-Voltage SiC VJFETs von Hippeli, J., Friedrichs, Peter, Elpelt, Rudolf, Türkes, Peter, Treu, Michael, Schörner, Reinhold

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Development of 5′ Nuclease Real-Time PCR Assays for the Rapid Identification of the Burkholderia Mallei//Burkholderia Pseudomallei Complex von Tomaso, Herbert, Scholz, Holger C, Al Dahouk, Sascha, Pitt, Tyrone L, Treu, Thomas M, Neubauer, Heinrich

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Generation of Stacking Faults in Highly Doped n-Type 4H-SiC Substrates von Zhang, M., McD. Hobgood, H., Treu, Michael, Pirouz, P.

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Challenges and First Results of SiC Schottky Diode Manufacturing using a 3-Inch Technology von Hecht, Christian, Rupp, Roland, Brunner, Helmut, Treu, Michael, Dahlquist, Fanny

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Abstract 14410: Hemoglobin A1c and Major Adverse Cardiovascular Events in the VA Million Veteran Program: Evidence-Based Recommendation for Life’s Essential Eight Improvement von Nguyen, Xuan-Mai T, Li, Yanping, Ho, Yuk-lam, Houghton, Serena, Pyatt, Mary, Treu, Timothy M, Posner, Daniel, RAGHAVAN, SRIDHARAN, Gagnon, David, Rahman, Saad Ur, Gaziano, John, Djousse, Luc, Phillips, Lawrence, WILSON, PETER, Cho, Kelly

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Abstract 14359: Life’s Essential 8 and Cardiovascular Health of Veterans: The Million Veteran Program von Nguyen, Xuan-Mai T, Li, Yanping, Ho, Yuk-lam, Houghton, Serena, Ivey, Kerry, Pyatt, Mary, Treu, Timothy M, Posner, Daniel, Li, Ruifeng, RAGHAVAN, SRIDHARAN, Gagnon, David, Gaziano, John, Djousse, Luc, WILSON, PETER, Cho, Kelly

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Abstract 12911: Life’s Essential 8 and Heart Failure: The Million Veteran Program von Li, Yanping, Nguyen, Xuan-Mai T, Treu, Timothy M, Wang, Dong D, Ho, Yuk-lam, Houghton, Serena, Posner, Daniel, RAGHAVAN, SRIDHARAN, Pyatt, Mary, Gagnon, David, Whitbourne, Stacey B, Gaziano, John, Djousse, Luc, Joseph, Jacob, Wilson, Peter, Kim, Kelly

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Reliability of metal–oxide–semiconductor capacitors on nitrogen implanted 4H-silicon carbide von Treu, M., Burte, E. P., Schörner, R., Friedrichs, P., Stephani, D., Ryssel, H.

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Bladder stone as a rare complication one year after laparoscopic herniorrhaphy von Maier, Ulrich, Treu, Thomas M.

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Reliability of SiC power devices and its influence on their commercialization - review, status, and remaining issues von Treu, M, Rupp, R, Solkner, G

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