Expanding the attack surface: Robust profiling attacks threaten the privacy of sparse behavioral data von Tournier, Arnaud J, de Montjoye, Yves-Alexandre

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Adversarial competition and collusion in algorithmic markets von Rocher, Luc, Tournier, Arnaud J., de Montjoye, Yves-Alexandre

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Radiation Hardness of Modern Photogate Pixels Under Total Ionizing Dose: Impact of Pixel Pitch and Electron or Hole Collection von Malherbe, Victor, Nier, Olivier, Moindjie, Soilihi, Roche, Philippe, Roy, Francois, Tournier, Arnaud

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Adverse effects of learning algorithms: case studies on data privacy and algorithmic pricing von Tournier, Arnaud

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Displacement Damage Induced Dark Current and Random Telegraph Signal in P-Type Deep-Trench Pinned Photogates von Antonsanti, Aubin, Malherbe, Victor, Alj, Antoine Salih, Roch, Alexandre Le, Ryder, Landen D., Roche, Philippe, Tournier, Arnaud, Virmontois, Cedric, Lauenstein, Jean-Marie, Goiffon, Vincent

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1T Pixel Using Floating-Body MOSFET for CMOS Image Sensors von Lu, Guo-Neng, Tournier, Arnaud, Roy, François, Deschamps, Benoît

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Reliability of the hybrid bonding level using submicrometric bonding pads von Lhostis, S., Ayoub, B., Frémont, H., Moreau, S., Mattei, J.-G., Lamontagne, P., Tournier, A.

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Displacement Damage Effects on a CDTI-based CCD-on-CMOS: Dark Current and Charge Transfer Inefficiency von Alj, Antoine Salih, Antonsanti, Aubin, Roch, Alexandre Le, Touron, Pierre, Roy, Francois, Tournier, Arnaud, Demiguel, Stephane, Michelot, Julien, Lalucaa, Valerian, Virmontois, Cedric, Magnan, Pierre, Goiffon, Vincent

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Dark Current and Clock-Induced Charges in a Fully Depleted Charge Domain CDTI-Based CCD-on-CMOS Image Sensor von Salih Alj, Antoine, Touron, Pierre, Roy, Francois, Tournier, Arnaud, Michelot, Julien, Demiguel, Stephane, Virmontois, Cedric, Lalucaa, Valerian, Magnan, Pierre, Goiffon, Vincent

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De Brunsbüttel à Kinshasa - Le droit de la réparation dans la jurisprudence des cours mondiales à l’aune de l’arrêt Diallo von Tournier, Arnaud

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A 2.2-μm-pitch single-transistor charge-modulation pixel in a 0.13-μm CMOS process von TOURNIER, Arnaud, LU, Guo-Neng, ROY, Francois, DESCHAMPS, Benoit

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PHOTODIODE von RODRIGUES GONCALVES, Boris, TOURNIER, Arnaud

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Data for "Expanding the attack surface: robust profiling attacks threaten the privacy of sparse behavioral data" von Tournier, Arnaud Jacques

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1.4- mu m-Pitch 50% Fill-Factor 1T Charge-Modulation Pixel for CMOS Image Sensors von Tournier, A, Roy, F, Lu, G-N, Deschamps, B

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Photodiode comprising a memory area von Lalanne, Frederic, Tournier, Arnaud, Rodrigues Goncalves, Boris

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ELECTRONIC PHOTODIODE DEVICE von RODRIGUES GONCALVES, Boris, TOURNIER, Arnaud, ROY, François

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1.4-μm-Pitch 50% Fill-Factor IT Charge-Modulation Pixel for CMOS Image Sensors von TOURNIER, Arnaud, ROY, F, LU, G.-N, DESCHAMPS, B

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Photodiode von Tournier, Arnaud, Rodrigues Goncalves, Boris

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ELECTRONIC DEVICE COMPRISING A PHOTODIODE von RODRIGUES GONCALVES, Boris, ROY, Francois, TOURNIER, Arnaud

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PHOTODIODE COMPRISING A MEMORY AREA von RODRIGUES GONCALVES, Boris, TOURNIER, Arnaud, FONTENEAU, Pascal, LALANNE, Frederic

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