Diffusion distribution model for damage mitigation in scanning transmission electron microscopy von Moshtaghpour, Amirafshar, Velazco‐Torrejon, Abner, Nicholls, Daniel, Robinson, Alex W., Kirkland, Angus I., Browning, Nigel D.

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Image Restoration from Subsampled STEM Measurements using Deep Learning von Moshtaghpour, Amirafshar, Terris, Matthieu, Davies, Mike, Kirkland, Angus, Torrejón, Abner Velazco

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High-Z Nanoparticle Tagging in Cryo-STEM for Localisation in Cryo-ET: Theory and Damage von Bowles, William, Velazco-Torrejon, Abner, Ramadurai, Siva, Gallagher-Jones, Marcus, Kirkland, Angus, Siebert, Alistair, Naismith, James, Dumoux, Maud

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Towards Low-dose and Fast 4-D Scanning Transmission Electron Microscopy: New Sampling and Reconstruction Approaches von Moshtaghpour, Amirafshar, Velazco-Torrejon, Abner, Robinson, Alex, Liberti, Emanuela, Kim, Judy S., Browning, Nigel D., Kirkland, Angus I.

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LoRePIE: $\ell_0$ Regularised Extended Ptychographical Iterative Engine for Low-dose and Fast Electron Ptychography von Moshtaghpour, Amirafshar, Velazco-Torrejon, Abner, Robinson, Alex W, Browning, Nigel D, Kirkland, Angus I

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Diffusion Distribution Model for Damage Mitigation in Scanning Transmission Electron Microscopy von Moshtaghpour, Amirafshar, Velazco-Torrejon, Abner, Nicholls, Daniel, Robinson, Alex W, Kirkland, Angus I, Browning, Nigel D

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LoRePIE: \(\ell_0\) Regularised Extended Ptychographical Iterative Engine for Low-dose and Fast Electron Ptychography von Moshtaghpour, Amirafshar, Velazco-Torrejon, Abner, Robinson, Alex W, Browning, Nigel D, Kirkland, Angus I

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Diffusion Distribution Model for Damage Mitigation in Scanning Transmission Electron Microscopy von Moshtaghpour, Amirafshar, Velazco-Torrejon, Abner, Nicholls, Daniel, Robinson, Alex W, Kirkland, Angus I, Browning, Nigel D

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