High-aperture EUV microscope using multilayer mirrors and a 3D reconstruction algorithm based on z-tomography von Malyshev, I V, Reunov, D G, Chkhalo, N I, Toropov, M N, Pestov, A E, Polkovnikov, V N, Tsybin, N N, Lopatin, A Ya, Chernyshev, A K, Mikhailenko, M S, Smertin, R M, Pleshkov, R S, Shirokova, O M

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Resolving capacity of the circular Zernike polynomials von Svechnikov, M V, Chkhalo, N I, Toropov, M N, Salashchenko, N N

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A double-stream Xe:He jet plasma emission in the vicinity of 6.7 nm von Chkhalo, N. I., Garakhin, S. A., Golubev, S. V., Lopatin, A. Ya, Nechay, A. N., Pestov, A. E., Salashchenko, N. N., Toropov, M. N., Tsybin, N. N., Vodopyanov, A. V., Yulin, S.

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Problems in the application of a null lens for precise measurements of aspheric mirrors von Chkhalo, N I, Malyshev, I V, Pestov, A E, Polkovnikov, V N, Salashchenko, N N, Toropov, M N, Soloviev, A A

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Diffraction limited X-ray optics: technology, metrology, applications von Chkhalo, N I, Malyshev, I V, Pestov, A E, Polkovnikov, V N, Salashchenko, N N, Toropov, M N

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Method for Obtaining Atomically Smooth Substrates from Single-Crystal Silicon by Mechanical Lapping von Chkhalo, N. I., Akhsakhalyan, A. A., Zorina, M. V., Toropov, M. N., Tokunov, Yu. M.

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Application of Cerium Oxide Nanopowders for Silicon Polishing von Chkhalo, N. I., Akhsakhalyan, A. A., Vainer, Yu. A., Zorina, M. V., Pestov, A. E., Svechnikov, M. V., Toropov, M. N., Kumar, N., Tokunov, Yu. M.

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Wavefront Lens Corrector for Studying Flat Surfaces von Toropov, M. N., Akhsakhalyan, A. A., Malyshev, I. V., Mikhaylenko, M. S., Pestov, A. E., Salaschenko, N. N., Chernyshov, A. K., Chkhalo, N. I.

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Diamond–Carbide–Silicon Composite “Skeleton” as a Promising Material for X-Ray Optical Substrates von Zorina, M. V., Mikhailenko, M. S., Pestov, A. E., Toropov, M. N., Chernyshev, A. K., Chkhalo, N. I., Gordeev, S. K., Vitkin, V. V.

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Application of point diffraction interferometry for middle spatial frequency roughness detection von Svechnikov, M V, Chkhalo, N I, Toropov, M N, Salashchenko, N N, Zorina, M V

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Obtaining of Smooth High-Precision Surfaces by the Mechanical Lapping Method von Toropov, M. N., Akhsakhalyan, A. A., Zorina, M. V., Salashchenko, N. N., Chkhalo, N. I., Tokunov, Yu. M.

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Imaging System of a Plasma Torch of a Betatron X-Ray Source von Antyushin, E. S., Akhsakhalyan, A. A., Zuev, S. Yu, Lopatin, A. Ya, Malyshev, I. V., Nechay, A. N., Perekalov, A. A., Pestov, A. E., Salashchenko, N. N., Toropov, M. N., Ulasevich, B. A., Tsybin, N. N., Chkhalo, N. I., Soloviev, A. A., Starodubtsev, M. V.

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Reflective Schmidt-Cassegrain system for large-aperture telescopes von Brychikhin, M N, Chkhalo, N I, Eikhorn, Ya O, Malyshev, I V, Pestov, A E, Plastinin, Yu A, Polkovnikov, V N, Rizvanov, A A, Salashchenko, N N, Strulya, I L, Toropov, M N

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Solar VUV Telescope for Nanosatellites von Kuzin, S. V., Bogachev, S. A., Erkhova, N. F., Pertsov, A. A., Loboda, I. P., Reva, A. A., Kholodilov, A. A., Ulyanov, A. S., Kirichenko, A. S., Malyshev, I. V., Pestov, A. E., Polkovnikov, V. N., Toropov, M. N., Tsybin, N. N., Chkhalo, N.I., Kryukovskiy, V. A., Gorev, V. N., Doroshkin, A. A., Zadorozhniy, A. M., Prokop’ev, V. Yu

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Lasing efficiency of krypton ions in the (8 - 14)-nm band upon pulsed laser excitation von Nechay, A.N., Garakhin, S.A., Lopatin, A.Ya, Polkovnikov, V.N., Reunov, D.G., Salashchenko, N.N., Toropov, M.N., Chkhalo, N.I., Tsybin, N.N.

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On the Project of Scanning and Projection Microscopes for the Nanoscope Station for Biological Research in the Water Window von Malyshev, I. V., Pestov, A. E., Polkovnikov, V. N., Reunov, D. G., Toropov, M. N., Chkhalo, N. I., Rakshun, Ya. V., Khomyakov, Yu. V., Chernov, V. A., Shchelokov, I. A.

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Current status and development prospects for multilayer X-ray optics at the Institute for Physics of Microstructures, Russian Academy of Sciences von Akhsakhalyan, A. D., Kluenkov, E. B., Lopatin, A. Ya, Luchin, V. I., Nechay, A. N., Pestov, A. E., Polkovnikov, V. N., Salashchenko, N. N., Svechnikov, M. V., Toropov, M. N., Tsybin, N. N., Chkhalo, N. I., Shcherbakov, A. V.

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Current State of Development of a Microscope Operating at a Wavelength of 3.37 nm at the Institute of Physics of Microstructures of the Russian Academy of Sciences von Malyshev, I. V., Pestov, A. E., Polkovnikov, V. N., Salashchenko, N. N., Toropov, M. N., Chkhalo, N. I.

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Application of point diffraction interferometry for measuring angular displacement to a sensitivity of 0.01 arcsec von Gavrilin, D A, Kuzin, S V, Salashchenko, N N, Svechnikov, M V, Toropov, M N, Chkhalo, N I, Soloviev, A A

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Measurement Error of Interferometers with Diffraction Reference Wave von Akhsakhalyan, A. A., Gavrilin, D. A., Malyshev, I. V., Salashchenko, N. N., Toropov, M. N., Ulasevich, B. A., Tsybin, N. N., Chkhalo, N. I.

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