GaN Thin Films on SiC Substrates Studied Using Variable Energy Positron Annihilation Spectroscopy von Xie, M.H., Tu, J., Anwand, W., Shan, Y.Y., Beling, C.D., Brauer, Gerhard, Hu, Y.F., Fung, S., Tong, D.S.Y., Cheung, S.H.

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