Handbook of Ellipsometry von Tompkins, Harland, Irene, Eugene A

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Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry von Hilfiker, James N., Singh, Neha, Tiwald, Tom, Convey, Diana, Smith, Steven M., Baker, Jeffrey H., Tompkins, Harland G.

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Titanium nitride oxidation chemistry : an x-ray photoelectron spectroscopy study von SAHA, N. C, TOMPKINS, J. G

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Use of Molecular Vibrations to Analyze Very Thin Films with Infrared Ellipsometry von Tompkins, Harland G, Tiwald, Tom, Bungay, Corey, Hooper, Andrew E

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Preface von Tompkins, Harland G.

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The initial stages of the oxidation of titanium nitride von TOMPKINS, H. G

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Optimizing the ellipsometric analysis of a transparent layer on glass von Tompkins, Harland G., Smith, Steven, Convey, Diana

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Oxidation of titanium nitride in room air and in dry O2 von TOMPKINS, H. G

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Synergism of transmission measurements with spectroscopic ellipsometry measurements in the analysis of a nearly opaque bimetal film stack on glass von Tompkins, Harland G., Tasic, Sonja

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Convenient calibration of FTIR peak 'size' for thin organic/polymer films von Hooper, Andrew E., Tompkins, Harland G.

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Determining the amount of Si-Si bonding in CVD oxynitrides von Tompkins, Harland G., Smith, Steven, Convey, Diana, Gregory, R. B., Kottke, M. L., Collins, David

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Handbook of Ellipsometry von Tompkins, Harland G., Irene, Eugene A

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5th International Conference on Spectroscopic Ellipsometry (ICSE-V) von TOMPKINS, Harland G

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Spectroscopic ellipsometry measurements of thin metal films von Tompkins, Harland G., Tasic, Sonja, Baker, Jeff, Convey, Diana

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Handbook of ellipsometry von Tompkins, Harland, Irene, Eugene A

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Industrial applications of spectroscopic ellipsometry von Tompkins, Harland G.

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Measuring the thickness of organic/polymer/biological films on glass substrates using spectroscopic ellipsometry von Tompkins, Harland G., Tiwald, Tom, Bungay, Corey, Hooper, Andrew E.

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Film thickness measurements using ellipsometry when the lower interface is uncharacterized von Tompkins, Harland G

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Industrial applications of spectroscopic ellipsometry von TOMPKINS, Harland G

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An inorganic anti-reflective coating for use in photolithography von TOMPKINS, H. G, SELLERS, J. A, TRACY, C

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