We-W41:4 CD4+ natural killer T cells augment atherosclerosis in apolipoprotein-E deficient mice von To, K.Y.Y., Toh, B.H., Godfrey, D., Bobik, A.

Volltext

Results of the treatment of keratocystic odontogenic tumours using enucleation and treatment of the residual bony defect with Carnoy's solution von Leung, Y.Y, Lau, S.L, Tsoi, K.Y.Y, Ma, H.L, Ng, C.L

Volltext

Granulomatous mastitis: Presentation, treatment and outcome in 43 patients von Kok, K.Y.Y, Telisinghe, P.U

Volltext

Laparoscopic adrenal-sparing surgery for primary hyperaldosteronism due to aldosterone-producing adenoma von KOK, K. Y. Y, YAPP, S. K. S

Volltext

4K-cells Resistive and Charge-Base-Capacitive Measurement Test Structure Array (R-CBCM-TSA) for CMOS Logic Process Development, Monitor and Model von Doong, K.Y.Y., Keh-Jeng Chang, Lin, S.-C., Tseng, H.C., Dagonis, A., Pan, S.

Volltext

Laparoscopic excision of congenital bladder diverticulum in a child von Kok, K Y, Seneviratne, H S, Chua, H B, Yapp, S K

Volltext

Supplementary Material for: A Prospective Cohort Study of Fecal miR-223 and miR-451a as Noninvasive and Specific Biomarkers for Diagnosis of Necrotizing Enterocolitis in Preterm In... von Ng, P.C., K.Y.Y., Chan, Lam, H.S., R.P.O., Wong, T.P.Y., Ma, Sit, T., Leung, K.T., L.C.N., Chan, Pang Y.L.I., Cheung, H.M., W.C.W., Chu, Li, K.

Volltext bestellen

Field-configurable test structure array (FC-TSA): enabling design for monitor, model and manufacturability von Doong, K.Y.Y., Bordelon, J., Keh-Jeng Chang, Hung, L.J., Liao, C.C., Lin, S.C., Ho, R.S., Hsieh, S., Young, K.L.

Volltext

The role of test structures for yield enhancement and yield ramp-up: an example of adoptive yield enhancement (AYE): n/sup +//p-well junction leakage enhanced the abnormal leakage... von Doong, K.Y.Y., Binson Shen, Sunnys Hsieh, Sheng-che Lin, Hsu, C.C.-H.

Volltext

Modeling Sub-90nm On-Chip Variation Using Monte Carlo Method for DFM von Huang, J.-F., Chang, V.C.Y., Liu, S., Doong, K.Y.Y., Chang, K.-J.

Volltext

The effect of CF/sub 4/ plasma on the device parameters and reliability properties of 0.18 /spl mu/m MOSFETs von Wang, R.C.J., Shih, J.R., Chu, L.H., Doong, K.Y.Y., Wang, L.S., Weil, P.C., Su, D.S., Yang, C.T., Chiu, C.C., Su, D., Peng, Y.K., Yue, J.T., Lee, J.Y.M.

Volltext bestellen

Electrical characterization of model-based dummy feature insertion in Cu interconnects von Doong, K.Y.Y., Lin, K.-C., Tseng, T.-C., Lu, Y.C., Lin, S.C., Hung, L.J., Ho, P.S., Hsieh, S., Young, K.L., Liang, M.S.

Volltext bestellen