In-situ monitoring of alkanethiol self-assembled monolayer chemisorption with combined spectroscopic ellipsometry and quartz crystal microbalance techniques von Rodenhausen, K.B., Duensing, B.A., Kasputis, T., Pannier, A.K., Hofmann, T., Schubert, M., Tiwald, T.E., Solinsky, M., Wagner, M.

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Optical properties of photochromic organic–inorganic composites von Mo, Yeon-Gon, Dillon, R.O, Snyder, P.G, Tiwald, T.E

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Micelle-assisted bilayer formation of cetyltrimethylammonium bromide thin films studied with combinatorial spectroscopic ellipsometry and quartz crystal microbalance techniques von Rodenhausen, K.B., Guericke, M., Sarkar, A., Hofmann, T., Ianno, N., Schubert, M., Tiwald, T.E., Solinsky, M., Wagner, M.

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The Origin of the Berreman Effect in SiC Homostructures von Zollner, St, Carrejo, J. P., Tiwald, T. E., Woollam, J. A.

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Optical investigations of mixed-phase boron nitride thin films by infrared spectroscopic ellipsometry von Schubert, M., Franke, E., Neumann, H., Tiwald, T.E., Thompson, D.W., Woollam, J.A., Hahn, J.

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Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example von Schubert, M., Rheinländer, B., Franke, E., Neumann, H., Tiwald, T. E., Woollam, J. A., Hahn, J., Richter, F.

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Interface states in modulation-doped In/sub 0.52/Al/sub 0.48/As/In/sub 0.53/Ga/sub 0.47/As heterostructures von Hong, W.-P., Oh, J.-E., Bhattacharya, P.K., Tiwald, T.E.

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Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range von Franke, Eva, Schubert, Mathias, Neumann, Horst, Tiwald, Thomas E., Thompson, Daniel W., Woollam, John A., Hahn, Jens, Richter, Frank

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Infrared ellipsometry on hexagonal and cubic boron nitride thin films von Franke, E., Neumann, H., Schubert, M., Tiwald, T. E., Woollam, J. A., Hahn, J.

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Infrared free carrier response of In0.15Ga0.85As0.17Sb0.83 epilayers on GaSb von Snyder, P.G., Tiwald, T.E., Thompson, D.W., Ianno, N.J., Woollam, J.A., Mauk, M.G., Shellenbarger, Z.A.

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Infrared free carrier response of In 0.15Ga 0.85As 0.17Sb 0.83 epilayers on GaSb von Snyder, P.G., Tiwald, T.E., Thompson, D.W., Ianno, N.J., Woollam, J.A., Mauk, M.G., Shellenbarger, Z.A.

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Materials Characterization in the Vacuum Ultraviolet with Variable Angle Spectroscopic Ellipsometry von Wagner, T., Hilfiker, J.N., Tiwald, T.E., Bungay, C.L., Zollner, S.

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Phonons and Free Carriers in a Strained Hexagonal GaN-AlN Superlattice Measured by Infrared Ellipsometry and Raman Spectroscopy von Schubert, M., Kasic, A., Tiwald, T.E., Woollam, J.A., Härle, V., Scholz, F.

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Optical phonons and free-carrier effects in MOVPE grown Al x Ga 1−x N measured by Infrared Ellipsometry von Schubert, M., Kasic, A., Tiwald, T.E., Off, J., Kuhn, B., Scholz, Ferdinand

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Ellipsometric and magneto-optic properties of sputtered dysprosium-iron multilayers von TIWALD, T. E, WOOLLAM, J. A, SELLMYER, D. J

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Variable angle spectroscopic magneto-optics and ellipsometry: Application to DyCo multilayers (abstract) von Tiwald, Thomas E., McGahan, William A., Shan, Z. S., Massengale, Alan M., Woollam, John A.

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