Clinical Outcomes of Ventral Hernia Repair with Ventralex Patch- A Retrospective Study from a Tertiary Care Centre von Victor, Coelho, Titus, DK, Roopavathana, Beulah, Nadarajan, Abinaya R, Chase, Suchita, Nayak, Sukria

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Anaerobic regulation by an atypical Arc system in Shewanella oneidensis von Gralnick, Jeffrey A., Brown, C. Titus, Newman, Dianne K.

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Resolution of diabetic cheiroarthropathy after pancreatic transplantation von Hider, Samantha L, Roy, Dipak K, Augustine, Titus, Parrott, Neil, Bruce, Ian N

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Melting and defect generation in chemical vapor deposited diamond due to irradiation with 100 MeV Au+ and Ag+ ions von Misra, D.S., Palnitkar, Umesh, Tyagi, Pawan K., Singh, M.K., Titus, E., Avasthi, D.K., Vasa, P., Ayyub, P.

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A study of various morphologic variables and troponin I in pericardial fluid as possible discriminators of sudden cardiac death von Cina, S J, Thompson, W C, Fischer, Jr, J R, Brown, D K, Titus, J M, Smialek, J E

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Effect of heavy ion irradiation on self-supported diamond sheets von Palnitkar, Umesh, Shirodkar, V.S., Singh, Manoj K., Titus, Elby, Tyagi, P.K., Unni, K.N., Misra, D.S., Ayuub, P., Avasthi, D.K.

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Current single event effects and radiation damage results for candidate spacecraft electronics von O'Bryan, M.V., LaBel, K.A., Ladbury, R.L., Poivey, C., Howard, J.W., Reed, R.A., Kniffin, S.D., Buchner, S.P., Bings, J.P., Titus, J.L., Clark, S.D., Turflinger, T.L., Seidleck, C.M., Marshall, C.J., Marshall, P.W., Kim, H.S., Hawkins, D.K., Carts, M.A., Forney, J.D., Jones, M.R., Sanders, A.B., Irwin, T.L., Cox, S.R., Kahric, Z.A., Palor, C.D., Sciarini, J.A.

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Single event effects results for candidate spacecraft electronics for NASA von O'Bryan, M.V., LaBel, K.A., Howard, J.W., Poivey, C., Ladbury, R.L., Kniffin, S.D., Buchner, S.P., Xapsos, M., Reed, R.A., Sanders, A.B., Seidleck, C.M., Marshall, C.J., Marshall, P.W., Titus, J., McMorrow, D., Li, K., Gambles, J., Stone, R.F., Patterson, J.D., Kim, H.S., Hawkins, D.K., Carts, M.A., Forney, J.D., Irwin, T., Kahric, Z., Cox, S.R., Palor, C.

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Update of single event failure in power MOSFETs von Nichols, D.K., Coss, J.R., Miyahira, T., Titus, J., Oberg, D., Wert, J., Majewski, P., Lintz, J.

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