Deformation twinning and grain partitioning in a hexagonal close-packed magnesium alloy von Arul Kumar, M., Clausen, B., Capolungo, L., McCabe, R. J., Liu, W., Tischler, J. Z., Tomé, C. N.

Volltext

Elastically driven anisotropic percolation in electronic phase-separated manganites von Shen, J, Ward, T. Z, Budai, J. D, Gai, Z, Tischler, J. Z, Yin, Lifeng

Volltext

Symmetry Relationship and Strain-Induced Transitions between Insulating M1 and M2 and Metallic R phases of Vanadium Dioxide von Tselev, A, Luk’yanchuk, I. A, Ivanov, I. N, Budai, J. D, Tischler, J. Z, Strelcov, E, Kolmakov, A, Kalinin, S. V

Volltext

Three-dimensional X-ray structural microscopy with submicrometre resolution von Larson, B. C, Yang, Wenge, Ice, G. E, Budai, J. D, Tischler, J. Z

Volltext

Boundary migration in a 3D deformed microstructure inside an opaque sample von Zhang, Y. B., Budai, J. D., Tischler, J. Z., Liu, W., Xu, R., Homer, E. R., Godfrey, A., Juul Jensen, D.

Volltext

Lattice Rotation Patterns and Strain Gradient Effects in Face-Centered-Cubic Single Crystals Under Spherical Indentation von Gao, Y. F, Larson, B. C, Lee, J. H, Nicola, L, Tischler, J. Z, Pharr, G. M

Volltext

Polychromatic X-ray microdiffraction studies of mesoscale structure and dynamics von Ice, G. E., Larson, B. C., Yang, W., Budai, J. D., Tischler, J. Z., Pang, J. W. L., Barabash, R. I., Liu, W.

Volltext

Experimental setup combining in situ hard X-ray photoelectron spectroscopy and real-time surface X-ray diffraction for characterizing atomic and electronic structure evolution duri... von Eres, Gyula, Rouleau, C. M., Lu, Q., Zhang, Z., Benda, E., Lee, Ho Nyung, Tischler, J. Z., Fong, D. D.

Volltext

Polychromatic X-ray micro- and nanodiffraction for spatially-resolved structural studies von Budai, J.D., Liu, W., Tischler, J.Z., Pan, Z.W., Norton, D.P., Larson, B.C., Yang, W., Ice, G.E.

Volltext

In situ X-ray microdiffraction studies inside individual VO2 microcrystals von Budai, J.D., Tselev, A., Tischler, J.Z., Strelcov, E., Kolmakov, A., Liu, W.J., Gupta, A., Narayan, J.

Volltext

Dislocation Density Tensor Characterization of Deformation Using 3D X-Ray Microscopy von Larson, B. C., Tischler, J. Z., El-Azab, Anter, Liu, Wenjun

Volltext

X-ray microbeam measurements of subgrain stress distributions in polycrystalline materials von Ice, G.E., Larson, B.C., Tischler, J.Z., Liu, W., Yang, W.

Volltext

Phase-specific elastic/plastic interface interactions in layered NiAl–Cr(Mo) structures von Barabash, R.I., Liu, W., Tischler, J.Z., Bei, H., Budai, J.D.

Volltext

Time-resolved study of SrTiO3 homoepitaxial pulsed-laser deposition using surface x-ray diffraction von Eres, G., Tischler, J. Z., Yoon, M., Larson, B. C., Rouleau, C. M., Lowndes, D. H., Zschack, P.

Volltext

Differential-aperture X-ray structural microscopy: a submicron-resolution three-dimensional probe of local microstructure and strain von Yang, Wenge, Larson, B.C, Tischler, J.Z, Ice, G.E, Budai, J.D, Liu, W

Volltext

Fabrication of nested elliptical KB mirrors using profile coating for synchrotron radiation X-ray focusing von Liu, Chian, Ice, G.E., Liu, W., Assoufid, L., Qian, J., Shi, B., Khachatryan, R., Wieczorek, M., Zschack, P., Tischler, J.Z.

Volltext

Unit cell orientation of tetragonal-like BiFeO3 thin films grown on highly miscut LaAlO3 substrates von Beekman, Christianne, Siemons, Wolter, Ward, Thomas Z, Budai, John D, Tischler, Jonathan, Xu, Ruqing, Liu, Wenjun, Balke, Nina, Nam, Joong Hee, Christen, Hans M

Volltext

Interfacial bonding and structure of Bi2Te3 topological insulator films on Si(111) determined by surface x-ray scattering von Liu, Y, Wang, H-H, Bian, G, Zhang, Z, Lee, S S, Fenter, P A, Tischler, J Z, Hong, H, Chiang, T-C

Volltext

Nonresonant inelastic x-ray scattering and energy-resolved Wannier function investigation of d-d excitations in NiO and CoO von Larson, B C, Ku, Wei, Tischler, J Z, Lee, Chi-Cheng, Restrepo, O D, Eguiluz, A G, Zschack, P, Finkelstein, K D

Volltext

Micron-resolution 3-D measurement of local orientations near a grain-boundary in plane-strained aluminum using X-ray microbeams von Larson, B.C., Yang, Wenge, Tischler, J.Z., Ice, G.E., Budai, J.D., Liu, W., Weiland, H.

Volltext