Negative spherical aberration ultrahigh-resolution imaging in corrected transmission electron microscopy von Urban, Knut W., Jia, Chun-Lin, Houben, Lothar, Lentzen, Markus, Mi, Shao-Bo, Tillmann, Karsten

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Progress in atomic-resolution aberration corrected conventional transmission electron microscopy (CTEM) von Urban, Knut W., Barthel, Juri, Houben, Lothar, Jia, Chun-Lin, Jin, Lei, Lentzen, Markus, Mi, Shao-Bo, Thust, Andreas, Tillmann, Karsten

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Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the occasi... von Dunin-Borkowski, Rafal E., Mayer, Joachim, Sachse, Carsten, Tillmann, Karsten

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Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Christian Colliex, Archie Howie and Hannes Lichte on the occasion of their 75t... von Dunin-Borkowski, Rafal E., Mayer, Joachim, Sachse, Carsten, Tillmann, Karsten

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Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Robert Sinclair and Nestor J. Zaluzec on the occasion of their 70th and 65th b... von Dunin-Borkowski, Rafal E., Mayer, Joachim, Tillmann, Karsten

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Introduction to a Special Issue on Frontiers of Aberration Corrected Electron Microscopy dedicated to Harald Rose on the occasion of his 80th Birthday von Mayer, Joachim, Tillmann, Karsten

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Introduction to a special issue in honour of W. Owen Saxton, David J. Smith and Dirk Van Dyck on the occasion of their 65th birthdays von Dunin-Borkowski, Rafal E, Lichte, Hannes, Tillmann, Karsten, Van Aert, Sandra, Van Tendeloo, Gustaaf

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FEI Tecnai G2 F20 von Luysberg, Martina, Heggen, Marc, Tillmann, Karsten

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FEI Helios NanoLab 400S FIB-SEM von Meertens, Doris, Kruth, Max, Tillmann, Karsten

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FEI Helios NanoLab 460F1 FIB-SEM von Kruth, Max, Meertens, Doris, Tillmann, Karsten

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WITHDRAWN: Introduction to a special issue in honour of W. Owen Saxton, David J. Smith and Dirk Van Dyck on the occasion of their 65th birthdays von Dunin-Borkowski, Rafal E., Lichte, Hannes, Tillmann, Karsten, Van Aert, Sandra, Van Tendeloo, Gustaaf

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FEI Titan G2 60-300 HOLO von Boothroyd, Chris, Kovács, András, Tillmann, Karsten

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FEI Titan G2 80-200 CREWLEY von Kovács, András, Schierholz, Roland, Tillmann, Karsten

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FEI Titan 80-300 STEM von Heggen, Marc, Luysberg, Martina, Tillmann, Karsten

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FEI Titan 80-300 TEM von Thust, Andreas, Barthel, Juri, Tillmann, Karsten

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FEI Titan G3 50-300 PICO von Barthel, Juri, Houben, Lothar, Tillmann, Karsten

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Introduction to a special issue in honour of W. Owen Saxton, David J. Smith and Dirk Van Dyck on the occasion of their 65th birthdays von Lichte, Hannes, Tillmann, Karsten, Van Aert, Sandra, Van Tendeloo, Gustaaf

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Spherical-aberration correction in tandem with the restoration of the exit-plane wavefunction : synergetic tools for the imaging of lattice imperfections in crystalline solids at a... von TILLMANN, Karsten, HOUBEN, Lothar, THUST, Andreas, URBAN, Knut

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Quantitative pressure and strain field analysis of helium precipitates in silicon von HUEGING, Norbert, LUYSBERG, Martina, TRINKAUS, Helmut, TILLMANN, Karsten, URBAN, Knut

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Frontiers of Electron Microscopy in Materials Science 2005 von Urban, Knut, Mayer, Joachim, Luysberg, Martina, Tillmann, Karsten

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