On the Trade-Off Between Quality Factor and Tuning Ratio in Tunable High-Frequency Capacitors von Tiggelman, M.P.J., Reimann, K., Van Rijs, F., Schmitz, J., Hueting, R.J.E.

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Ferroelectric Thin-Film Capacitors and Piezoelectric Switches for Mobile Communication Applications von Klee, Mareike, Van Esch, Marco, Keur, Wilco, Kumar, B., Van Leuken-Peters, Linda, Liu, J., Mauczok, Rudiger, Neumann, Kai, Reimann, Klaus, Renders, Christel, Roest, Aarnoud L., Tiggelman, Mark P.J., De Wild, Marco, Wunnicke, Olaf, Zhao, J.

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Ba x Sr 1 − x Ti 1.02O 3 metal–insulator–metal capacitors on planarized alumina substrates von Tiggelman, M.P.J., Reimann, K., Klee, M., Mauczock, R., Keur, W., Hueting, R.J.E.

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BaxSr1-xTi1.02O3 metal-insulator-metal capacitors on planarized alumina substrates von TIGGELMAN, M. P. J, REIMANN, K, KLEE, M, MAUCZOCK, R, KEUR, W, HUETING, RJ. E

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Identifying dielectric and resistive electrode losses in high-density capacitors at radio frequencies von Tiggelman, M.P.J., Reimann, K., Liu, J., Klee, M., Keur, W., Mauczock, R., Schmitz, J., Hueting, R.J.E.

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Reducing AC impedance measurement errors caused by the DC voltage dependence of broadband high-voltage bias-tees von Tiggelman, M.P.J., Reimann, K., Schmitz, J.

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MI004 miniaturised, high performance ferroelectric and piezoelectric thin film devices von Klee, M., Keur, W., Mauczok, R., van Esch, H., de Wild, M., Liu, J., Roest, A., Reimann, K., Renders, Ch, Peters, L., Tiggelman, M.P.J., Wunnicke, O., Neumann, K.

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C-V test structures for metal gate CMOS von Bankras, R.G., Tiggelman, M.P.J., Adi Negara, M., Sasse, G.T., Schmitz, J.

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