Contribution of CIRP to the Development of Metrology and Surface Quality Evaluation during the last fifty years von Peters, J., Bryan, J.B., Estler, W.T., Evans, C., Kunzmann, H., Lucca, D.A., Sartori, S., Sato, H., Thwaite, E.G., Vanherck, P., Hocken, R.J., Peklenik, J., Pfeifer, T., Trumpold, H., Vorburger, T.V.

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International conference on manufacturing engineering von Thwaite, E.G.

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Industrial Uses of STM and AFM Contribution of the National Institute of Standards and Technology. Not subject to copyright except for illustrations taken from other sources von Vorburger, T.V., Dagata, J.A., Wilkening, G., Lizuka, K., Thwaite, E.G., Lonardo, P.

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Length-Bar and Step-Gauge Calibration Using a Laser Measurement System with a Coordinate Measuring Machine von Lingard, P.S., Purss, M.E., Sona, C.M., Thwaite, E.G.

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A quantitative comparison of the wavelength spectrum of a surface obtained by optical fourier transformation with calculations from profile measurements von Thwaite, E.G.

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Measurement and control of surface finish in manufacture von Thwaite, E.G.

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The direct measurement of the power spectrum of rough surfaces by optical fourier transformation von Thwaite, E.G.

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Power Spectra of Rough Surfaces Obtained by Optical Fourier Transformation von Thwaite, E.G., Puttock, M.J.

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Temperature perturbation effects in a high precision CMM von Lingard, P.S., Purss, M.E., Sona, C.M., Thwaite, E.G., Mariasson, G.H.

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The Extension of Optical Angular Scattering Techniques to the Measurement of Intermediate Scale Roughness von Thwaite, E.G., Puttock, M.J.

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A 10 mm measuring machine based on a compensated laser interferometer von Thwaite, E.G., King, H.

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The numerical interpretation of topography von Thwaite, E.G.

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An appraisal of errors of orientation and sampling in the estimation of parameters of rough surfaces von O'callaghan, M., Thwaite, E.G.

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Recent Developments in Hardness Testing and their Implications for Standardisation von Bell, T.J., Thwaited, E.G.

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