Probing Defects in a Small Pixellated CdTe Sensor Using an Inclined Mono Energetic X-Ray Micro Beam von Frojdh, Erik, Frojdh, C., Gimenez, E. N., Krapohl, D., Maneuski, D., Norlin, B., O'Shea, V., Wilhelm, H., Tartoni, N., Thungstrom, G., Zain, R. M.

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A different approach for determining the responsivity of n super(+)p detectors using scanning electron microscopy von Esebamen, O X, Thungstroem, G, Nilsson, H-E

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An optimized system for measurement of radon levels in buildings by spectroscopic measurement of radon progeny von Fröjdh, A, Thungström, G, Fröjdh, C, Petersson, S

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Measurement of the sensitive profile in a solid state silicon detector, irradiated by X-rays von Thungström, G, Herrnsdorf, L, Norlin, B, Reza, S, Krapohl, D, Mattsson, S, Gunnarsson, M

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Simulation of a silicon neutron detector coated with TiB sub(2) absorber von Krapohl, D, Nilsson, H-E, Petersson, S, Pospisil, S, Slavicek, T, Thungstroem, G

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Depth of interaction and bias voltage depenence of the spectral response in a pixellated CdTe detector operating in time-over-threshold mode subjected to monochromatic X-rays von Froejdh, E, Froejdh, C, Gimenez, EN, Maneuski, D, Marchal, J, Norlin, B, O'Shea, V, Stewart, G, Wilhelm, H, Zain, R M, Thungstroem, G

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High resolution, low energy electron detector von Esebamen, O X, Krapohl, D, Thungström, G, Nilsson, H -E

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Simulation and measurement of short infrared pulses on silicon position sensitive device von Krapohl, D, Esebamen, O X, Nilsson, H E, Thungström, G

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Analysis and improvement of the position nonlinearity caused by a residual stress in MOS-type position-sensitive detectors with indium tin oxide gate contact von Andersson, H A, Bylund, N, Thungström, G, Nilsson, H-E

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Deposition of scintillating layers of bismuth germanate (BGO) films for X-ray detector applications von Duan, M., Frojdh, C., Thungstrom, G., Wang, L.W., Linnros, J., Petersson, C.S.

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