Effect of deposition conditions and post deposition anneal on reactively sputtered titanium nitride thin films von Ponon, Nikhil K., Appleby, Daniel J.R., Arac, Erhan, King, P.J., Ganti, Srinivas, Kwa, Kelvin S.K., O'Neill, Anthony

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Bending collapse analysis for thin and medium-thin-walled square and rectangular hollow shapes von Lavayen-Farfan, Daniel, Boada, Maria Jesus L., Rodriguez-Hernandez, Jorge A.

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Structural and electrochemical properties of high quality epitaxial titanium carbide thin films grown by pulsed laser deposition on MgO (111) and Al2O3 (001) substrates von Ranger, Nicolas, Constantinescu, Catalin-Daniel, Lucas-Roper, Romain, Boulle, Alexandre, Glandut, Nicolas

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Mechanistic Studies of the Oxygen Evolution Reaction Mediated by a Nickel–Borate Thin Film Electrocatalyst von Bediako, D. Kwabena, Surendranath, Yogesh, Nocera, Daniel G

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Revisiting the Optical Band Gap in Epitaxial BiFeO3 Thin Films von Sando, Daniel, Carrétéro, Cécile, Grisolia, Mathieu N., Barthélémy, Agnès, Nagarajan, Valanoor, Bibes, Manuel

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Explicit equations for anti-symmetric distortional buckling of thin-walled lipped channel columns von de Salles, Guilherme C., Batista, Eduardo de M., Cardoso, Daniel C.T.

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Extension of modal decomposition approach for buckling analysis of thin-walled lipped channel columns: Local, distortional, flexural and torsional modes von de Salles, Guilherme C., Batista, Eduardo de M., Cardoso, Daniel C.T.

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Disconnecting structure and dynamics in glassy thin films von Sussman, Daniel M., Schoenholz, Samuel S., Cubuk, Ekin D., Liu, Andrea J.

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30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered TiN-SiOx thin film von Keckes, J., Daniel, R., Todt, J., Zalesak, J., Sartory, B., Braun, S., Gluch, J., Rosenthal, M., Burghammer, M., Mitterer, C., Niese, S., Kubec, A.

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Fabrication of optically smooth Sn thin films von Borra, Vamsi, Georgiev, Daniel G., Grice, Corey R.

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Neurotypical Peers are Less Willing to Interact with Those with Autism based on Thin Slice Judgments von Sasson, Noah J., Faso, Daniel J., Nugent, Jack, Lovell, Sarah, Kennedy, Daniel P., Grossman, Ruth B.

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X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films von Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G., Ecker, W., Vila-Comamala, J., David, C., Schoeder, S., Burghammer, M.

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The anisotropic size effect of the electrical resistivity of metal thin films: Tungsten von Zheng, Pengyuan, Gall, Daniel

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Anisotropic Bruggeman effective medium approaches for slanted columnar thin films von Schmidt, Daniel, Schubert, Mathias

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Density and size effects on the thermal conductivity of atomic layer deposited TiO2 and Al2O3 thin films von DeCoster, Mallory E., Meyer, Kelsey E., Piercy, Brandon D., Gaskins, John T., Donovan, Brian F., Giri, Ashutosh, Strnad, Nicholas A., Potrepka, Daniel M., Wilson, Adam A., Losego, Mark D., Hopkins, Patrick E.

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SnS thin-films by RF sputtering at room temperature von Hartman, Katy, Johnson, J.L., Bertoni, Mariana I., Recht, Daniel, Aziz, Michael J., Scarpulla, Michael A., Buonassisi, Tonio

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Atomic layer deposition of copper sulfide thin films von Schneider, Nathanaelle, Lincot, Daniel, Donsanti, Frédérique

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Strain and orientation engineering in ABO3perovskite oxide thin films von Sando, Daniel

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Three-dimensional electroactive ZnO nanomesh directly derived from hierarchically self-assembled block copolymer thin films von Subramanian, Ashwanth, Doerk, Gregory, Kisslinger, Kim, Yi, Daniel H, Grubbs, Robert B, Nam, Chang-Yong

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Strain and orientation engineering in ABO3 perovskite oxide thin films von Sando, Daniel

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