A comparative study of the UV optical and structural properties of SiO2, Al2O3, and HfO2 single layers deposited by reactive evaporation, ion-assisted deposition and plasma ion-ass... von THIELSCH, R, GATTO, A, HEBER, J, KAISER, N

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Oxidation behaviour of thin silver films deposited on plastic web characterized by spectroscopic ellipsometry (SE) von Sahm, H, Charton, C, Thielsch, R

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Structure-related optical properties of laser-deposited BaxSr1−xTiO3 thin films grown on MgO (001) substrates von Thielsch, R., Kaemmer, K., Holzapfel, B., Schultz, L.

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High-performance deep-ultraviolet optics for free-electron lasers von Gatto, Alexandre, Thielsch, Roland, Heber, Joerg, Kaiser, Norbert, Ristau, Detlev, Günster, Stephan, Kohlhaas, Juergen, Marsi, Marino, Trovò, Mauro, Walker, Richard, Garzella, David, Couprie, Marie Emmanuelle, Torchio, Philippe, Alvisi, Marco, Amra, Claude

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Deep UV laser induced fluorescence in fluoride thin films von Heber, J., Mühlig, C., Triebel, W., Danz, N., Thielsch, R., Kaiser, N.

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Mechanical stress and thermal-elastic properties of oxide coatings for use in the deep-ultraviolet spectral region von Thielsch, Roland, Gatto, Alexandre, Kaiser, Norbert

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XPS studies and factor analysis of PbS nanocrystal-doped SiO2 thin films von Reiche, R, Thielsch, R, Oswald, S, Wetzig, K

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Interference Phenomena at Transparent Layers in Glow Discharge Optical Emission Spectrometry von Hoffmann, V., Kurt, R., Kämmer, K., Thielsch, R., Wirth, Th, Beck, U.

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Optical and Structural Properties of Nanocrystalline ZnS-SiO2 Composite Films von Thielsch, R., Böhme, T., Böttcher, H.

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Structure and electrical properties of PZT thick films produced by plasma spraying von Haessler, W., Thielsch, R., Mattern, N.

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Optical properties of TiO2, Y2O3 and CeO2 thin films deposited by electron beam evaporation von ATANASSOV, G, THIELSCH, R, POPOV, D

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Quantum-size effects of PbS nanocrystallites in evaporated composite films von Thielsch, R., Böhme, T., Reiche, R., Schläfer, D., Bauer, H.-D., Böttcher, H.

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Oxidation behaviour of thin silver films deposited on plastic web characterized by spectroscopic ellipsometry (SE) von SAHM, H, CHARTON, C, THIELSCH, R

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Preparation and properties of Ge microcrystals in MgF 2 layers von Thielsch, R., Böttcher, H.

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XPS studies and factor analysis of PbS nanocrystal-doped SiO 2 thin films von Reiche, R, Thielsch, R, Oswald, S, Wetzig, K

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Verfahren zur Herstellung einer dielektrischen Reflexionsmaske von Rubahn, K, Ihlemann, J, Thielsch, R

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User Evaluation of Websites: From First Impression to Recommendation von Thielsch, Meinald T., Blotenberg, Iris, Jaron, Rafael

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Metal-insulator transition in amorphous Si 1 − x Ni x : Evidence for Mott’s minimum metallic conductivity von Möbius, A., Frenzel, C., Thielsch, R., Rosenbaum, R., Adkins, C. J., Schreiber, M., Bauer, H.-D., Grötzschel, R., Hoffmann, V., Krieg, T., Matz, N., Vinzelberg, H., Witcomb, M.

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The metal-insulator transition in amorphous Si_{1-x}Ni_x: Evidence for Mott's minimum metallic conductivity von Mobius, A, Frenzel, C, Thielsch, R, Rosenbaum, R, Adkins, C. J, Schreiber, M, Bauer, H. -D, Grotzschel, R, Hoffmann, V, Krieg, T, Matz, N, Vinzelberg, H, Witcomb, M

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Differences in the sensitivity among cryptic lineages of the Gammarus fossarum complex von Feckler, A., Thielsch, A., Schwenk, K., Schulz, R., Bundschuh, M.

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