When are transmission-line effects important for on-chip interconnections? von Deutsch, A., Kopcsay, G.V., Restle, P.J., Smith, H.H., Katopis, G., Becker, W.D., Coteus, P.W., Surovic, C.W., Rubin, B.J., Dunne, R.P., Gallo, T., Jenkins, K.A., Terman, L.M., Dennard, R.H., Sai-Halasz, G.A., Krauter, B.L., Knebel, D.R.

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A substrate-plate trench-capacitor (SPT) memory cell for dynamic RAM's von Lu, N.C., Cottrell, P.E., Craig, W.J., Dash, S., Critchlow, D.L., Mohler, R.L., Machesney, B.J., Ning, T.H., Noble, W.P., Parent, R.M., Scheuerlein, R.E., Sprogis, E.J., Terman, L.M.

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Investigation of the thermal degradation products of copolymers of oligoorganovinylsiloxanes with styrene von Terman, L. M., Khvoinova, N. M., Zislina, S. S., Nefedov, P. P.

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Barbara Stoddard Burks, 1902-1943 von Terman, L. M

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The use of intelligence tests in the army von Terman, L. M

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Tests of general intelligence von Terman, L. M

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Overview of CCD memory von Terman, L.M., Heller, L.G.

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A variable precharge voltage sensing von Eirihata, T., Dhong, S.H., Terman, L.M., Sunaga, T., Taira, Y.

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A two-stage weighted capacitor network for D/A-A/D conversion von Yee, Y.S., Terman, L.M., Heller, L.G.

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The Mental Test as a Psychological Method von Terman, L. M

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The influence of nature and nurture upon intelligence scores: An evaluation of the evidence in Part I of the 1928 Yearbook of the National Society for the Study of Education von Terman, L. M

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A New Approach to the Study of Genius von Terman, L. M

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An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes von Terman, L.M.

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A self-aligned 1-μm-channel CMOS technology with retrograde n-well and thin epitaxy von TAUR, Y, HU, G. J, DENNARD, R. H, TERMAN, L. M, CHUNG-YU TING, PETRILLO, K. E

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The impact of device scaling limits von Terman, Lewis M.

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The impact of device scaling limits von TERMAN, L. M

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Correlates of Orgasm Adequacy in a Group of 556 Wives von Terman, L. M.

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A 1 mV MOS comparator von Yee, Y.S., Terman, L.M., Heller, L.G.

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Intelligence and Its Measurement: A Symposium--II von Terman, L. M

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FET memory systems von Terman, L.

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