ELDRS Susceptibility of Bipolar Transistors and Integrated Circuits During Low-Temperature Irradiation von Bakerenkov, Alexander S., Pershenkov, Viacheslav S., Felitsyn, Vladislav A., Rodin, Alexander S., Telets, Vitaly A., Belyakov, Vladimir V., Shurenkov, Vladimir V.

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Enhanced low dose rate sensitivity (ELDRS) and reduced low dose rate sensitivity (RLDRS) in bipolar devices von Pershenkov, Vyacheslav, Bakerenkov, Alexander, Rodin, Alexander, Felitsyn, Vladislav, Zhukov, Alexander, Telets, Vitaly, Belyakov, Vladimir

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IS TRUSTED ELECTRONICS A "NEW CIVILIAN"? von Vitaly A. Telets

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Design Issues of Radiation Tolerant RF Frequency Synthesizer ICs von Denis I., Sotskov, Vadim V., Elesin, Alexander G., Kuznetsov, Galina N., Nazarova, Georgy V., Chukov, Nikolay A., Usachev, Vitaly A., Telets

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Infl uence of the Choice of Controlled Validity Criteria Parameters on the Result of Estimation of Radiation Hardness Level for Modern Solidstate Microwave Electronics von Georgy V., Chukov, Vadim V., Elesin, Galina N., Nazarova, Nikolay A., Usachev, Dmitriy V., Boychenko, Alexander Yu, Nikiforov, Vitaly A., Telets

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