Characterization of electrically-active defects in ultraviolet light-emitting diodes with laser-based failure analysis techniques von Miller, Mary A., Tangyunyong, Paiboon, Cole, Edward I.

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Identification of radiation-induced parasitic leakage paths using light emission microscopy von Shaneyfelt, M.R., Paiboon Tangyunyong, Hill, T.A., Soden, J.M., Flores, R.S., Schwank, J.R., Dodd, P.E., Hash, G.L.

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Characterization of electrically-active defects in ultraviolet light-emitting diodes with laser-based failure analysis techniques von Miller, Mary A., Tangyunyong, Paiboon, Cole, Edward I.

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Diagnosis of factors impacting yield in multilayer devices for superconducting electronics von Missert, Nancy A., Jenkins, Mark W., Tangyunyong, Paiboon, Mook, William, Vernik, I., Kirichenko, A., Mukhanov, O., Wynn, A., Day, A. L., Bolkhovsky, V., Johnson, L.

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Thermal modeling of localized laser heating in multi-level interconnects von Tangyunyong, Paiboon

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Failure Analysis Techniques for Microsystems-Enabled Photovoltaics von Yang, Benjamin B., Cruz-Campa, Jose L., Haase, Gaddi S., Cole, Edward I., Tangyunyong, Paiboon, Resnick, Paul J., Kilgo, Alice C., Okandan, Murat, Nielson, Gregory N.

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Thermal Modeling of TIVA Profiles of a Polysilcon-Metal Test Structure von Benson, D.A., Cole, E.I. Jr, Tangyunyong, Paiboon

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Fault localization and failure modes in microsystems-enabled photovoltaic devices von Yang, B. B., Cruz-Campa, J. L., Haase, G. S., Tangyunyong, P., Cole, Edward I., Pimentel, A. A., Resnick, P. J., Okandan, M., Nielson, G. N.

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Thermal modeling of a polysilicon-metal test structure used for thermally induced voltage alteration characterization von Tangyunyong, Paiboon, Benson, David, Cole, Edward I.

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Various Applications of Power Spectrum Analysis (PSA) von Tangyunyong,Paiboon, Udoni,Darlene M, Loubriel,Guillermo M

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Defect screening method for electronic circuits and circuit components using power spectrum anaylysis von Cole, Jr., Edward I, Beutler, Joshua, Tangyunyong, Paiboon, Loubriel, Guillermo M

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Scanning method for screening of electronic devices von Cole, Jr., Edward I, Beutler, Joshua, Tangyunyong, Paiboon, Loubriel, Guillermo M

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Frequency dependence of the lifetime of a surface micromachined microengine driving a load von Tanner, Danelle M, Miller, William M, Peterson, Ken A, Dugger, Michael T, Eaton, William P, Irwin, Lloyd W, Senft, Donna C, Smith, Norman F, Tangyunyong, Paiboon, Miller, Samuel L

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Power spectrum analysis for defect screening in integrated circuit devices von COLE, JR. EDWARD I, STEIN DAVID J, TANGYUNYONG PAIBOON

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Local thermal probing to detect open and shorted IC interconnections von Cole, Edward I., Tangyunyong, Paiboon, Barton, Daniel L.

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Transient power supply voltage (V/sub DDT/) analysis for detecting IC defects von Cole, E.I., Soden, J.M., Tangyunyong, P., Candelaria, P.L., Beegle, R.W., Barton, D.L., Henderson, C.L., Hawkins, C.F.

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Backside localization of open and shorted IC interconnections von Cole, E.I. Jr, Tangyunyong, P., Barton, D.L.

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Scanning fluorescent microthermal imaging apparatus and method von BARTON, DANIEL L, TANGYUNYONG, PAIBOON

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System and method for floating-substrate passive voltage contrast von COLE, JR. EDWARD I, PIMENTEL ALEJANDRO A, WALRAVEN JEREMY A, JENKINS MARK W, TANGYUNYONG PAIBOON, SODEN JERRY M

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System and method for floating-substrate passive voltage contrast von Jenkins, Mark W, Cole, Jr, Edward I, Tangyunyong, Paiboon, Soden, Jerry M, Walraven, Jeremy A, Pimentel, Alejandro A

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