Alpha-Particle Emission Energy Spectra From Materials Used for Solder Bumps von Gordon, M S, Rodbell, K P, Heidel, D F, Murray, C E, Tang, H H K, Dwyer-McNally, B, Warburton, W K

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Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells von Rodbell, K.P., Heidel, D.F., Tang, H.H.K., Gordon, M.S., Oldiges, P., Murray, C.E.

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Selected Topics in Ultra-Low Emissivity Alpha-Particle Detection von Gordon, Michael S., Rodbell, Kenneth P., Tang, Henry H. K., Yashchin, Emmanuel, Cascio, Ethan W., McNally, Brendan D.

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Ultra-Low Emissivity Alpha-Particle Detection von Gordon, M. S., Rodbell, K. P., Tang, H. H. K., Ronsheim, P., Zhu, Z., Rauch, S. E., McNally, B. D., Coleman, S.

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Single-Event-Upset Critical Charge Measurements and Modeling of 65 nm Silicon-on-Insulator Latches and Memory Cells von Heidel, D.F., Rodbell, K.P., Oldiges, P., Gordon, M.S., Tang, H.H.K., Cannon, E.H., Plettner, C.

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Importance of BEOL Modeling in Single Event Effect Analysis von Tang, H.H.K., Murray, C.E., Fiorenza, G., Rodbell, K.P., Gordon, M.S.

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Single-Event Upsets in Microelectronics: Fundamental Physics and Issues von Tang, Henry H.K., Rodbell, Kenneth P.

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Single-Event Upsets in Microelectronics von Tang, Henry H.K., Olsson, Nils

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Protecting Big Blue from Rogue Subatomic Particles von Cannon, E.H., KleinOsowski, A., Gordon, M.S., Heidel, D.F., Hergenrother, J., Muller, K.P., Oldiges, P., Plettner, C., Reinhardt, D.D., Rodbell, K.P., Tang, H.H.K.

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Method for conversion of commercial microprocessor to radiation-hardened processor and resulting processor von Rose Ronald D, Rodbell Kenneth P, Tang Henry H. K, Fifield John A, Hakey Mark C, Hibbeler Jason D, Nakos James S, Wissel Larry, Ning Tak H

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Structure for heavy ion tolerant device, method of manufacturing the same and structure thereof von HAKEY MARK C, NING TAK H, OLDIGES PHILIP J, TANG HENRY H. K

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Method and structures for accelerated soft-error testing von RODBELL KENNETH P, GORDON MICHAEL S, TANG HENRY H. K

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Method and structures for accelerated soft-error testing von Gordon, Michael S, Rodbell, Kenneth P, Tang, Henry H. K

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METHOD AND STRUCTURES FOR ACCELERATED SOFT-ERROR TESTING von RODBELL KENNETH P, GORDON MICHAEL S, TANG HENRY H. K

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Programmable heavy-ion sensing device for accelerated DRAM soft error detection von Chen, Howard H, Fifield, John A, Hsu, Louis L, Tang, Henry H. K

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Programmable heavy-ion sensing device for accelerated DRAM soft error detection von HSU LOUIS L, CHEN HOWARD H, FIFIELD JOHN A, TANG HENRY H. K

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Programmable heavy-ion sensing device for accelerated DRAM soft error detection von Chen, Howard H, Fifield, John A, Hsu, Louis L, Tang, Henry H. K

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Method and system for lowering action of soft error caused by radiation von KENNIS P. RODEBELL,HENRY H. K. TANG,ROBERT M. TREPE

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PROGRAMMABLE SENSING DEVICE, AND METHOD AND DRAM ARRAY (PROGRAMMABLE HEAVY-ION SENSING DEVICE FOR ACCELERATED DRAM SOFT ERROR) DETECTION FOR DETECTING SOFT ERRORS von LOUIS L SHEW, TANG HENRY H K, CHEN HOWARD H, FIFIELD JOHN A

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Microscopic and Macroscopic Aspects of Nuclear Dynamics in Mean-Field Approximation. (I. Formalism) von Kolomietz, V M, Tang, Henry H K

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