Test pin configuration for test device for testing devices under test von Sugianto, Yusman, Swee Lee, Gan, Chyeo Yong, Tay, Tan, Wee Kuan, Hudda, Murad, Hiew, Fu San, Yussuff, Arieff Ridzwan, Tan, Siao Kiat, Xiaojun, Wang, Dandong, Ge, Chow York, Lee

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Test Pin Configuration for Test Device for Testing Devices Under Test von TAN Wee Kuan, HIEW Fu San, TAN Siao Kiat, YUSSUFF Arieff Ridzwan, CHYEO YONG Tay, SUGIANTO Yusman, CHOW YORK Lee, SWEE LEE Gan, DANDONG Ge, HUDDA Murad, XIAOJUN Wang

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Prüfstiftkonfiguration für eine Prüfvorrichtung zum Prüfen von Prüflingen von Sugianto, Yusman, Gan, Swee Lee, Hudda, Murad, Tan, Wee Kuan, Hiew, Fu San, Yussuff, Arieff Ridzwan, Lee, Chow York, Tan, Siao Kiat, Ge, Dandong, Wang, Xiaojun, Tay, Chyeo Yong

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Age-dependent changes in steady-state visual evoked potentials von Chin, Siao-Shi, Mah, Wai-Lai, Mok, Siew-Ying, Ng, Danny Wee-Kiat, Tan, Lee-Fan, Tan, Yin-Qing, Ramli, Norlisah, Goh, Khean-Jin, Goh, Sing-Yau

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Germline Pathogenic Variants in Homologous Recombination and DNA Repair Genes in an Asian Cohort of Young-Onset Colorectal Cancer von Toh, Ming Ren, Chiang, Jian Bang, Chong, Siao Ting, Chan, Sock Hoai, Ishak, Nur Diana Binte, Courtney, Eliza, Lee, Wei Hao, Syed Abdillah Al, Syed Muhammad Fahmy Bin, Carson Allen, John, Lim, Kiat Hon, Davila, Sonia, Tan, Patrick, Lim, Weng Khong, Tan, Iain Bee Huat, Ngeow, Joanne

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