Impact of different backsheets and encapsulant types on potential induced degradation (PID) of silicon PV modules von Mahmood, Farrukh ibne, TamizhMani, Govindasamy

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Field-Aged Glass/Backsheet and Glass/Glass PV Modules: Encapsulant Degradation Comparison von Patel, Aesha Parimalbhai, Sinha, Archana, Tamizhmani, Govindasamy

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The 2020 photovoltaic technologies roadmap von Wilson, Gregory M, Al-Jassim, Mowafak, Metzger, Wyatt K, Glunz, Stefan W, Verlinden, Pierre, Xiong, Gang, Mansfield, Lorelle M, Stanbery, Billy J, Zhu, Kai, Yan, Yanfa, Berry, Joseph J, Ptak, Aaron J, Dimroth, Frank, Kayes, Brendan M, Tamboli, Adele C, Peibst, Robby, Catchpole, Kylie, Reese, Matthew O, Klinga, Christopher S, Denholm, Paul, Morjaria, Mahesh, Deceglie, Michael G, Freeman, Janine M, Mikofski, Mark A, Jordan, Dirk C, TamizhMani, Govindasamy, Sulas-Kern, Dana B

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Susceptibility to polarization type potential induced degradation in commercial bifacial p‐PERC PV modules von Mahmood, Farrukh ibne, Li, Fang, Hacke, Peter, Molto, Cécile, Colvin, Dylan, Seigneur, Hubert, TamizhMani, Govindasamy

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Comparative Analysis of Hotspot Stress Endurance in Pristine and Thermal Cycled Prestressed Glass–Glass Photovoltaic Modules von Afridi, Muhammad, Kumar, Akash, Mahmood, Farrukh ibne, TamizhMani, GovindaSamy

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Evaluation of bifacial module technologies with combined‐accelerated stress testing von Hacke, Peter, Kumar, Akash, Terwilliger, Kent, Ndione, Paul, Spataru, Sergiu, Pavgi, Ashwini, Choudhury, Kaushik Roy, Tamizhmani, Govindasamy

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Transient Weighted Moving-Average Model of Photovoltaic Module Back-Surface Temperature von Prilliman, Matthew, Stein, Joshua S., Riley, Daniel, Tamizhmani, Govindasamy

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Potential-Induced Degradation (PID): Incomplete Recovery of Shunt Resistance and Quantum Efficiency Losses von Jaewon Oh, Bowden, Stuart, TamizhMani, GovindaSamy

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Quantification of Environmental Effects on PV Module Degradation: A Physics-Based Data-Driven Modeling Method von Bala Subramaniyan, Arun, Pan, Rong, Kuitche, Joseph, TamizhMani, GovindaSamy

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Reliability of Microinverters for Photovoltaic Systems: High-Temperature Accelerated Testing with Fixed and Cyclic Power Stresses von Afridi, Muhammad, Tatapudi, Sai, Flicker, Jack, Srinivasan, Devarajan, Tamizhmani, Govindasamy

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Reduction of PV Module Temperature Using Thermally Conductive Backsheets von Oh, Jaewon, Rammohan, Balamurali, Pavgi, Ashwini, Tatapudi, Sai, Tamizhmani, Govindasamy, Kelly, George, Bolen, Michael

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Thermally Conductive Backsheets (TCB) of PV Modules: Positive Impacts on Performance, Lifetime and LCOE von Pavgi, Ashwini, Oh, Jaewon, TamizhMani, GovindaSamy

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Activation Energy for End-of-Life Solder Bond Degradation: Thermal Cycling of Field-Aged PV Modules von Gopalakrishna, Hamsini, Sinha, Archana, Carpenter, Joe, Niverty, Sridhar, Chawla, Nikhilesh, Jordan, Dirk, Tamizhmani, Govindasamy

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Damp Heat Induced Degradation of Silicon Heterojunction Solar Cells With Cu-Plated Contacts von Karas, Joseph, Sinha, Archana, Buddha, Viswa Sai Pavan, Li, Fang, Moghadam, Farhad, TamizhMani, Govindasamy, Bowden, Stuart, Augusto, Andre

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Prediction of Climate-Specific Degradation Rate for Photovoltaic Encapsulant Discoloration von Sinha, Archana, Gopalakrishna, Hamsini, Bala Subramaniyan, Arun, Jain, Deepak, Oh, Jaewon, Jordan, Dirk, TamizhMani, GovindaSamy

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Nondestructive Characterization and Accelerated UV Testing of Browned Field-Aged PV Modules von Gopalakrishna, Hamsini, Sinha, Archana, Dolia, Kshitiz, Jordan, Dirk, Tamizhmani, Govindasamy

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Investigation of Dominant Failure Mode(s) for Field-Aged Crystalline Silicon PV Modules Under Desert Climatic Conditions von Kuitche, Joseph M., Rong Pan, TamizhMani, GovindaSamy

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Dropout and Pruned Neural Networks for Fault Classification in Photovoltaic Arrays von Rao, Sunil, Muniraju, Gowtham, Tepedelenlioglu, Cihan, Srinivasan, Devarajan, Tamizhmani, Govindasamy, Spanias, Andreas

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Correlation of UV Fluorescence Images With Performance Loss of Field-Retrieved Photovoltaic Modules von Li, Fang, Buddha, Viswa Sai Pavan, Schneller, Eric J., Iqbal, Nafis, Colvin, Dylan J., Davis, Kristopher O., TamizhMani, GovindaSamy

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Surface Disruption Method With Flexible Glass to Prevent Potential-Induced Degradation of the Shunting Type in PV Modules von Oh, Jaewon, TamizhMani, GovindaSamy, Bowden, Stuart, Garner, Sean

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