Embedded deterministic test for low cost manufacturing test von Rajski, J., Tyszer, J., Kassab, M., Mukherjee, N., Thompson, R., Kun-Han Tsai, Hertwig, A., Tamarapalli, N., Mrugalski, G., Eide, G., Jun Qian

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Tutorial T10: Post - Silicon Validation, Debug and Diagnosis von Mishra, Prabhat, Fujita, Masahiro, Singh, Virendra, Tamarapalli, Nagesh, Kumar, Sharad, Mittal, Rajesh

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Automated synthesis of phase shifters for built-in self-test applications von Rajski, J., Tamarapalli, N., Tyszer, J.

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A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis von Keim, M., Tamarapalli, N., Tang, H., Sharma, M., Rajski, J., Schuermyer, C., Benware, B.

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Logic BIST for large industrial designs: real issues and case studies von Hetherington, G., Fryars, T., Tamarapalli, N., Kassab, M., Hassan, A., Rajski, J.

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Diagnosis with Limited Failure Information von Yu Huang, Wu-Tung Cheng, Tamarapalli, N., Rajski, J., Klingenberg, R.

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Compression mode diagnosis enables high volume monitoring diagnosis flow von Leininger, A., Muhmenthaler, P., Wu-Tung Cheng, Tamarapalli, N., Wu Yang, Hans Tsai

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Constructive multi-phase test point insertion for scan-based BIST von Tamarapalli, N., Rajski, J.

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Compactor independent direct diagnosis von Wu-Tung Cheng, Kun-Han Tsai, Yu Huang, Tamarapalli, N., Rajski, J.

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DFM, DFT, silicon debug and diagnosis -the loop to ensure product yield von Abercrombie, D., Koenemann, B., Tamarapalli, N., Venkataraman, S.

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Automated synthesis of large phase shifters for built-in self-test von Rajski, J., Tamarapalli, N., Tyszer, J.

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The Next Step in Volume Scan Diagnosis: Standard Fail Data Format von Leininger, A., Khoche, A., Fischer, M., Tamarapalli, N., Wu-Tung Cheng, Klingenberg, R., Wu Yang

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Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis von Tendolkar, N., Belete, D., Schwarz, B., Podnar, B., Gupta, A., Karako, S., Wu-Tung Cheng, Babin, A., Kun-Han Tsai, Tamarapalli, N., Aldrich, G.

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High-frequency, at-speed scan testing von Xijiiang Lin, Press, R., Rajski, J., Reuter, P., Rinderknecht, T., Swanson, B., Tamarapalli, N.

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Phase shifter with reduced linear dependency von Rajski, Janusz, Tyszer, Jerzy, Tamarapalli, Nagesh

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Phase shifter with reduced linear dependency von TAMARAPALLI NAGESH, RAJSKI JANUSZ, TYSZER JERZY

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PHASE SHIFTER WITH REDUCED LINEAR DEPENDENCY von TAMARAPALLI NAGESH, RAJSKI JANUSZ, TYSZER JERZY

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Phase shifter with reduced linear dependency von Rajski, Janusz, Tyszer, Jerzy, Tamarapalli, Nagesh

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Phase shifter with reduced linear dependency von TAMARAPALLI NAGESH, RAJSKI JANUSZ, TYSZER JERZY

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At-speed test using on-chip controller von Tamarapalli, Nagesh, Rajski, Janusz

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