Surface Layering in Ionic Liquids:  An X-ray Reflectivity Study von Sloutskin, Eli, Ocko, Benjamin M, Tamam, Lilach, Kuzmenko, Ivan, Gog, Thomas, Deutsch, Moshe

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Modification of deeply buried hydrophobic interfaces by ionic surfactants von Tamam, Lilach, Pontoni, Diego, Sapir, Zvi, Yefet, Shai, Sloutskin, Eli, Ocko, Benjamin M, Reichert, Harald, Deutsch, Moshe

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Atomic-Scale Structure of a Liquid Metal−Insulator Interface von Tamam, Lilach, Pontoni, Diego, Hofmann, Tommy, Ocko, Benjamin M, Reichert, Harald, Deutsch, Moshe

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Counterions under a Surface-Adsorbed Cationic Surfactant Monolayer: Structure and Thermodynamics von Sloutskin, Eli, Tamam, Lilach, Sapir, Zvi, Ocko, Benjamin M., Bain, Colin D., Kuzmenko, Ivan, Gog, Thomas, Deutsch, Moshe

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Surfactant-Induced Phases in Water-Supported Alkane Monolayers: II. Structure von Yefet, Shai, Sloutskin, Eli, Tamam, Lilach, Sapir, Zvi, Deutsch, Moshe, Ocko, Benjamin M

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Two-Dimensional Order in Mercury-Supported Langmuir Films of Fatty Diacids von Tamam, Lilach, Ocko, Benjamin M, Deutsch, Moshe

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Surfactant-Induced Phases in Water-Supported Alkane Monolayers: I. Thermodynamics von Yefet, Shai, Sloutskin, Eli, Tamam, Lilach, Sapir, Zvi, Cohen, Asaf, Deutsch, Moshe, Ocko, Benjamin M

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Hydrogen-Bonded Order in Mercury-Supported Monolayers of End-Functionalized Alkanes von Tamam, Lilach, Kraack, Henning, Sloutskin, Eli, Deutsch, Moshe

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The structure of Langmuir films of long diols on mercury von Tamam, Lilach, Ocko, Benjamin M, Nakamura, Naotake, Ogawa, Yoshihiro, Deutsch, Moshe

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Surface Layering in Ionic Liquids:  An X-ray Reflectivity Study [J. Am. Chem. Soc. 2005, 127, 7796−7804] von Sloutskin, Eli, Ocko, Benjamin M, Tamam, Lilach, Kuzmenko, Ivan, Gog, Thomas, Deutsch, Moshe

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Structure of Mercaptobiphenyl Monolayers on Mercury von Tamam, Lilach, Kraack, Henning, Sloutskin, Eli, Ocko, Benjamin M, Pershan, Peter S, Ulman, Abraham, Deutsch, Moshe

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Structure of Mercaptobiphenyl Monolayers on Mercury von Tamam, Lilach, Kraack, Henning, Sloutskin, Eli, Ocko, Benjamin M, Pershan, Peter S, Ulman, Abraham, Deutsch, Moshe

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SYSTEM AND METHOD FOR LIBRARY CONSTRUCTION AND USE IN MEASUREMENTS ON PATTERNED STRUCTURES von CAMUS, Yotam, PEIMER, Daphna, GOROHOVSKY, Zvi, OFEK, Jacob, GODEL, Amit, TAMAM, Lilach

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FULL-WAFER METROLOGY UP-SAMPLING von SHIFRIN, Michael, KAMPEL, Nir, COHEN, Jacob, ROTHSTEIN, Eitan A, VEDALA, Harindra, ABOODY, Effi, TAL, Noam, GER, Avron, TAMAM, Lilach

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Method for optical critical dimension metrology, system for optical critical dimension metrology and non-transitory, machine-accessible storage medium von TAL, NOAM, GER, AVRON, COHEN, JACOB, KAMPEL, NIR, TAMAM, LILACH, SHIFRIN, MICHAEL, ROTHSTEIN, EITAN, VEDALA, HARINDRA, ABOODY, EFFI

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Random Forest Algorithm Improves Detection of Physiological Activity Embedded within Reflectance Spectra Using Stomatal Conductance as a Test Case von Vitrack-Tamam, Snir, Holtzman, Lilach, Dagan, Reut, Levi, Shai, Tadmor, Yuval, Azizi, Tamir, Rabinovitz, Onn, Naor, Amos, Liran, Oded

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