The influence of coating technologies on stress-strain characteristics of the sample at periodic loading von Zakharchenko, K V, Zubkov, V P, Kapustin, V I, Maksimovski, E A, Talanin, A V

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Simulation of the creation of a defect structure of dislocation-free germanium single crystals von Talanin, V.I., Talanin, I.E., Matsko, O.

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High-Temperature Precipitation of Impurities in Metals von Talanin, V. I., Talanin, I. E.

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Complexation in germanium in accordance with Vlasov's model for solids von Talanin, V.I., Talanin, I.E.

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A kinetic model of the formation and growth of interstitial dislocation loops in dislocation free silicon single crystals von Talanin, V.I., Talanin, I.E.

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Complex formation in semiconductor silicon within the framework of the Vlasov model of a solid state von Talanin, V. I., Talanin, I. E.

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High-Temperature Precipitation of Impurities within the Vlasov Model for Solids von Talanin, V. I., Talanin, I. E.

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Diffusion model of the formation of growth microdefects: A new approach to defect formation in crystals (Review) von Talanin, V. I., Talanin, I. E.

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On the problem of the consistency of the high-temperature precipitation model with the classical nucleation theory von Talanin, V. I., Talanin, I. E.

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Diffusion model of the formation of growth microdefects as applied to the description of defect formation in heat-treated silicon single crystals von Talanin, V. I., Talanin, I. E.

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Kinetics of high-temperature precipitation in dislocation-free silicon single crystals von Talanin, V. I., Talanin, I. E.

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Kinetic model of growth and coalescence of oxygen and carbon precipitates during cooling of As-grown silicon crystals von Talanin, V. I., Talanin, I. E.

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Kinetics of formation of vacancy microvoids and interstitial dislocation loops in dislocation-free silicon single crystals von Talanin, V. I., Talanin, I. E.

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Physical nature of grown-in microdefects in Czochralski-grown silicon and their transformation during various technological effects von Talanin, V. I., Talanin, I. E.

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Mechanism of Formation and Physical Classification of the Grown-In Microdefects in Semiconductor Silicon von Talanin, V.I., Talanin, I.E.

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Physics of the formation of microdefects in dislocation-free monocrystals of float-zone silicon von Talanin, V I, Talanin, I E, Levinson, D I

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Analysis and calculation of the formation of grown-in microdefects in dislocation-free silicon single crystals von Talanin, V. I., Talanin, I. E., Ustimenko, N. Ph

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Modeling of defect formation processes in dislocation-free silicon single crystals von Talanin, V. I., Talanin, I. E.

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A New Method for Research of Grown-In Microdefects in Dislocation-Free Silicon Single Crystals von Talanin, V.I, Talanin, I.E, Ustimenko, N.Ph

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On the recombination of intrinsic point defects in dislocation-free silicon single crystals von Talanin, V. I., Talanin, I. E.

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