Surround Gate Transistor With Epitaxially Grown Si Pillar and Simulation Study on Soft Error and Rowhammer Tolerance for DRAM von Han, Jin-Woo, Kim, Jungsik, Beery, Dafna, Bozdag, K. Deniz, Cuevas, Peter, Levi, Amitay, Tain, Irwin, Tran, Khai, Walker, Andrew J., Palayam, Senthil Vadakupudhu, Arreghini, Antonio, Furnemont, Arnaud, Meyyappan, M.

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