Surface deep profile synchrotron studies of mechanically modified top-down silicon nanowires array using ultrasoft X-ray absorption near edge structure spectroscopy von Turishchev, S. Yu, Parinova, E. V., Pisliaruk, A. K., Koyuda, D. A., Yermukhamed, D., Ming, T., Ovsyannikov, R., Smirnov, D., Makarova, A., Sivakov, V.

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Thin-Film Oxide Materials for Ozone Detection in Thermal Modulation Mode von Ryabtsev, S. V., Obvintseva, N. Yu, Ghareeb, D. A. A., Al-Habeeb, A. A. K., Shaposhnik, A. V., Turishchev, S. Yu, Domashevskaya, E. P.

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First-Principles Calculation and X-ray Photoelectron Spectroscopy of Rutile-Like Transition Metal Oxides TiO2 and MoO2 von Manyakin, M. D., Kurganskii, S. I., Boikov, N. I., Kakuliia, I. S., Kannykin, S. V., Chuvenkova, O. A., Chumakov, R. G., Lebedev, A. M., Turishchev, S. Yu

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Formation of Plasmon–Exciton Nanostructures upon Decorating Ag2S/SiO2 Quantum Dots with Au Nanoparticles von Grevtseva, I. G., Ovchinnikov, O. V., Smirnov, M. S., Tikhomirov, S. A., Ponyavina, A. N., Binh, Nguyen Thanh, Minh, Pham Hong, Turishchev, S. Yu, Chuvenkova, O. A.

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Transformation of Trap States during the Formation of Luminescent Core/Shell Nanostructures Based on Ag2S Quantum Dots von Perepelitsa, A. S., Ovchinnikov, O. V., Smirnov, M. S., Grevtseva, I. G., Kondratenko, T. S., Aslanov, S. V., Turishchev, S. Yu, Chuvenkova, O. A., Bondarenko, D. A.

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Synchrotron characterization of functional tin dioxide nanowires von Domashevskaya, E P, Chuvenkova, O A, Yu, Turishchev S

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Ab initio calculation and synchrotron X-ray spectroscopy investigations of tin oxides near the Sn L 3 absorption edges von Manyakin, M. D., Kurganskii, S. I., Dubrovskii, O. I., Chuvenkova, O. A., Domashevskaya, E. P., Turishchev, S. Yu

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Theoretical and experimental study of the electronic structure of tin dioxide von Kurganskii, S. I., Manyakin, M. D., Dubrovskii, O. I., Chuvenkova, O. A., Turishchev, S. Yu, Domashevskaya, E. P.

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X-ray absorption near-edge structure anomalous behaviour in structures with buried layers containing silicon nanocrystals von Terekhov, V. A., Tetelbaum, D. I., Spirin, D. E., Pankov, K. N., Mikhailov, A. N., Belov, A. I., Ershov, A. V., Turishchev, S. Yu

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Formation of silicon nanocrystals in multilayer nanoperiodic a-SiO x /insulator structures from the results of synchrotron investigations von Turishchev, S. Yu, Terekhov, V. A., Koyuda, D. A., Ershov, A. V., Mashin, A. I., Parinova, E. V., Nesterov, D. N., Grachev, D. A., Karabanova, I. A., Domashevskaya, E. P.

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Interference phenomena of synchrotron radiation in TEY spectra for silicon-on-insulator structure von Andreeva, M. A., Domashevskaya, E. P., Odintsova, E. E., Terekhov, V. A., Turishchev, S. Yu

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XANES, USXES and XPS investigations of electron energy and atomic structure peculiarities of the silicon suboxide thin film surface layers containing Si nanocrystals von Terekhov, V. A., Turishchev, S. Yu, Pankov, K. N., Zanin, I. E., Domashevskaya, E. P., Tetelbaum, D. I., Mikhailov, A. N., Belov, A. I., Nikolichev, D. E., Zubkov, S. Yu

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Structure and optical properties of silicon nanopowders von Terekhov, V.A., Kashkarov, V.M., Turishchev, S.Yu, Pankov, K.N., Volodin, V.A., Efremov, M.D., Marin, D.V., Cherkov, A.G., Goryainov, S.V., Korchagin, A.I., Cherepkov, V.V., Lavrukhin, A.V., Fadeev, S.N., Salimov, R.A., Bardakhanov, S.P.

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Investigations of porous InP properties by XRD, IR, USXES, XANES and PL techniques von Domashevskaya, E.P., Kashkarov, V.M., Seredin, P.V., Terekhov, V.A., Turishchev, S.Yu, Arsentyev, I.N., Ulin, V.P.

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Plasmon-exciton nanostructures, based on CdS quantum dots with exciton and trap state luminescence von Derepko, V.N., Ovchinnikov, O.V., Smirnov, M.S., Grevtseva, I.G., Kondratenko, T.S., Selyukov, A.S., Turishchev, S. Yu

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Composition and electronic structure of porous silicon nanoparticles after oxidation under air- or freeze-drying conditions von Koyuda, D.A., Titova, S.S., Tsurikova, U.A., Kakuliia, I.S., Parinova, E.V., Chuvenkova, O.A., Chumakov, R.G., Lebedev, A.M., Kannykin, S.V., Osminkina, L.A., Turishchev, S.Yu

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Formation of Si nanocrystals in LP CVD semi-insulating polycrystalline silicon films von Domashevskaya, E.P., Terekhov, V.A., Parinova, E.V., Sinelnikov, A.A., Kharin, A.N., Prizhimov, A.S., Turishchev, S.Yu

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XPS investigations of MOCVD tin oxide thin layers on Si nanowires array von Turishchev, S.Yu, Chuvenkova, O.A., Parinova, E.V., Koyuda, D.A., Chumakov, R.G., Presselt, M., Schleusener, A., Sivakov, V.

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A novel approach to the electronic structure and surface composition investigations of tin-oxygen system materials by means of X-ray absorption spectroscopy combined with ab initio... von Manyakin, M.D., Kurganskii, S.I., Dubrovskii, O.I., Chuvenkova, O.A., Domashevskaya, E.P., Ryabtsev, S.V., Ovsyannikov, R., Turishchev, S.Yu

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Localization of Dps protein in porous silicon nanowires matrix von Parinova, E.V., Antipov, S.S., Sivakov, V., Belikov, E.A., Kakuliia, I.S., Trebunskikh, S.Yu, Turishchev, S.Yu

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