Electrically Induced Optical Emission from a Carbon Nanotube FET von Misewich, J. A., Martel, R., Ph. Avouris, Tsang, J. C., Heinze, S., Tersoff, J.

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Doping and phonon renormalization in carbon nanotubes von Avouris, Ph, Tsang, J. C, Freitag, M, Perebeinos, V, Liu, J

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Carbon nanotube optoelectronics von Avouris, Ph, Chen, J., Freitag, M., Perebeinos, V., Tsang, J. C.

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In situ x-ray diffraction study of graphitic carbon formed during heating and cooling of amorphous-C/Ni bilayers von Saenger, K. L., Tsang, J. C., Bol, A. A., Chu, J. O., Grill, A., Lavoie, C.

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Visualization of normal intra-parotid facial nerve on MR: BTFE or GRASS? von Tsang, J.C.H, Yip, W.H, Lau, C.S.L, Li, K.M, Lee, Y.Y.P, Wong, J.K.T, Ahuja, A.T

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LUMINESCENCE DEGRADATION IN POROUS SILICON von TISCHLER, MA, COLLINS, RT, STATHIS, JH, TSANG, JC

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Dynamic internal testing of CMOS circuits using hot luminescence von Kash, J.A., Tsang, J.C.

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Raman scattering analysis of relaxed GexSi1-x alloy layers von MOONEY, P. M, DACOL, F. H, TSANG, J. C, CHU, J. O

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GROWTH AND STRAIN COMPENSATION EFFECTS IN THE TERNARY SI1-X-YGEXCY ALLOY SYSTEM von EBERL, K, IYER, SS, ZOLLNER, S, TSANG, JC, LEGOUES, FK

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Testing and diagnostics of CMOS circuits using light emission from off-state leakage current von Stellari, F., Peilin Song, Tsang, J.C., McManus, M.K., Ketchen, M.B.

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SYNTHESIS OF SI1-YCY ALLOYS BY MOLECULAR-BEAM EPITAXY von IYER, SS, EBERL, K, GOORSKY, MS, LEGOUES, FK, TSANG, JC, CARDONE, F

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Raman scattering from H or O terminated porous Si von TSANG, J. C, TISCHLER, M. A, COLLINS, R. T

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Why hot carrier emission based timing probes will work for 50 nm, 1V CMOS technologies von Tsang, J.C., Fischetti, M.V.

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Growth temperature dependence of interfacial abruptness in Si/Ge heteroepitaxy studied by Raman spectroscopy and medium energy ion scattering von IYER, S. S, TSANG, J. C, COPEL, M. W, PUKITE, P. R, TROMP, R. M

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Hot-electron recombination at neutral acceptors in GaAs: a cw probe of femtosecond intervalley scattering von ULBRICH, R. G, KASH, J. A, TSANG, J. C

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Heat inactivation of trypsin inhibitors in soymilk at ultra-high temperatures von Kwok, K.C, Qin, W.H, Tsang, J.C

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High-speed CMOS circuit testing by 50 ps time-resolved luminescence measurements von Stellari, F., Zappa, F., Cova, S., Porta, C., Tsang, J.C.

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Subpicosecond time-resolved Raman spectroscopy of LO phonons in GaAs von KASH, J. A, TSANG, J. C, HVAM, J. M

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Watching chips work: picosecond hot electron light emission from integrated circuits von Kash, J.A, Tsang, J.C

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The Effect of Active Delay Element Resistance on Limiting Heavy Ion SEU Upset Cross-Sections of SOI ADE/SRAMs von Liu, S.T., Nelson, D.K., Tsang, J.C., Golke, K., Fechner, P., Heikkila, W., Brewster, N., Van Cleave, R., Liu, H.Y., McMarr, P.J., Hughes, H.L., Ziegler, J.F.

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