High-throughput atomic force microscopes operating in parallel von Sadeghian, Hamed, Herfst, Rodolf, Dekker, Bert, Winters, Jasper, Bijnagte, Tom, Rijnbeek, Ramon

Volltext

Automated Cantilever Exchange and Optical Alignment for High-Throughput Parallel Atomic Force Microscopy von Sadeghian, Hamed, Bijnagte, Tom, Herfst, Rodolf, Kramer, Geerten, Kramer, Lukas, Dekker, Bert

Volltext

Device and method for cleaning an extruder of an FFF system von KENT, Samuel Thomas, FLOOR, Jan Willem, BIJNAGTE, Tom

Volltext bestellen

Device and method for cleaning an extruder of an FFF system von TOM BIJNAGTE, SAMUEL THOMAS KENT, JAN WILLEM FLOOR

Volltext bestellen

Automated cantilever exchange and optical alignment for High-throughput, parallel atomic force microscopy von Bijnagte, Tom, Kramer, Geerten, Kramer, Lukas, Dekker, Bert, Herfst, Rodolf, Sadeghian, Hamed

Volltext bestellen

Automated cantilever exchange and optical alignment for High-throughput, parallel atomic force microscopy von Bijnagte, Tom, Kramer, Geerten, Kramer, Lukas, Dekker, Bert, Herfst, Rodolf, Sadeghian, Hamed

Volltext