Alignment of CS2 in intense nanosecond laser fields probed by pulsed gas electron diffraction von Hoshina, Kennosuke, Yamanouchi, Kaoru, Ohshima, Takashi, Ose, Yoichi, Todokoro, Hideo

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Direct observation of molecular alignment in an intense laser field by pulsed gas electron diffraction I: observation of anisotropic diffraction image von Hoshina, Kennosuke, Yamanouchi, Kaoru, Ohshima, Takashi, Ose, Yoichi, Todokoro, Hideo

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Direct observation of molecular alignment in an intense laser field by pulsed gas electron diffraction II: analysis of anisotropic diffraction image von Hoshina, Kennosuke, Yamanouchi, Kaoru, Ohshima, Takashi, Ose, Yoichi, Todokoro, Hideo

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Beam characteristics for various sizes of annular aperture on scanning electron microscope von Ishitani, Tohru, Sato, Mitsugu, Todokoro, Hideo

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Measurement technique for the incident electron current in secondary electron detectors and its application in scanning electron microscopes von Agemura, Toshihide, Fukuhara, Satoru, Todokoro, Hideo

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CHARGED PARTICLE BEAM DEVICE von TANIMOTO NORIFUMI, DOI TAKASHI, MATSUNAGA SOICHIRO, TODOKORO HIDEO, KAWANO HAJIME, ISHIKAWA SHUHEI, KATAGIRI SOUICHI, KASUYA KEIGO

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CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME von TODOKORO HIDEO, KOKUBO SHIGERU, KATAGIRI SOUICHI, KASUYA KEIGO, OSHIMA TAKU

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ELECTRONIC MICROSCOPE OBSERVATION SYSTEM AND OBSERVATION METHOD von TODOKORO, HIDEO

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Role of Ion Bombardment in Field Emission Current Instability von Todokoro, Hideo, Saitou, Norio, Yamamoto, Shigehiko

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CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME von TODOKORO HIDEO, KOKUBO SHIGERU, KATAGIRI SOUICHI, KASUYA KEIGO, OSHIMA TAKU

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Thermal Characteristics of Si Mask for EB Cell Projection Lithography von NakayamA, Yoshinori, Satoh, Hidetoshi, Saitou, Norio, Hirasawa, Shigeki, Yanagid, Takehiko, Todokoro, Hideo

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Aluminum-line cutting end-monitor utilizing scanning-ion-microscope voltage-contrast images von ISHITANI, T, KAWANAMI, Y, TODOKORO, H

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ELECTRON BEAM APPARATUS von TODOKORO, HIDEO, SATO, MITSUGU

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Spin-polarized scanning electron microscopy von KOIKE, K, MATSUYAMA, H, TODOKORO, H, HAYAKAWA, K

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Spin-polarized scanning electron microscope for magnetic domain observation von KOIKE, K, MATSUYAMA, H, TODOKORO, H, HAYAKAWA, K

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High spatial resolution spin-polarized scanning electron microscope von KOIKE, K, MATSUYAMA, H, TODOKORO, H, HAYAKAWA, K

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CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME von KOKUBO, SHIGERU, KATAGIRI, SOUICHI, TODOKORO, HIDEO, KASUYA, KEIGO, OHSHIMA, TAKASHI

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A Method of Measuring Lifetime for Minority Carriers Induced by an Electron Beam in Germanium von Munakata, Chusuke, Todokoro, Hideo

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ELECTRON BEAM SOURCE, AND ELECTRON-BEAM APPLICATION DEVICE von FUJIEDA, TADASHI, HAYASHIBARA, MITSUO, TODOKORO, HIDEO, OHSHIMA, TAKASHI, HIDAKA, KISHIO

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An Evaluation for the Depth of Field in SEM Image Depending on Accelerating Voltage von Sato, Mitsugu, Todokoro, Hideo, Nakagawa, Mine

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