Dynamic leakage current compensation in ferroelectric thin-film capacitor structures von Meyer, René, Waser, Rainer, Prume, Klaus, Schmitz, Torsten, Tiedke, Stephan

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Extensive electromechanical characterization of PZT thin films for MEMS applications by electrical and mechanical excitation signals von PRUME, Klaus, MURALT, Paul, CALAME, Florian, SCHMITZ-KEMPEN, Thorsten, TIEDKE, Stephan

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Infrared-laser based characterization of the pyroelectricity in AlScN thin-films von Bette, Sebastian, Fichtner, Simon, Bröker, Sebastian, Nielen, Lutz, Schmitz-Kempen, Thorsten, Wagner, Bernhard, Van Buggenhout, Carl, Tiedke, Stephan, Tappertzhofen, Stefan

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Piezoelectric thin films: evaluation of electrical and electromechanical characteristics for MEMS devices von Prume, K., Muralt, P., Calame, F., Schmitz-Kempen, T., Tiedke, S.

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Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element S... von Prume, Klaus, Roelofs, Andreas, Schmitz, Thorsten, Reichenberg, Bernd, Tiedke, Stephan, Waser, Rainer

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Effective Piezoelectric Coefficients of Ferroelectric Thin Films on Elastic Substrates von Zalachas, Nicolas, Laskewitz, Bernd, Kamlah, Marc, Prume, Klaus, Lapusta, Yuri, Tiedke, Stephan

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Dynamic leakage current compensation in ferroelectric thin-filmcapacitor structures von Meyer, René, Waser, Rainer, Prume, Klaus, Schmitz, Torsten, Tiedke, Stephan

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Determining capacitance of capacitor, by compensating for current caused by stray capacitance of measuring arrangement e.g. using second capacitor and inverting amplifier von SCHMITZ, THORSTEN, TIEDKE, STEPHAN

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Ferroelectric capacitor`s technical characteristic determining method, involves determining electrical currents by creating alternating voltage at capacitor, and deriving current p... von SCHMITZ-KEMPEN, THORSTEN, PRUME, KLAUS, MEYER, RENE, TIEDKE, STEPHAN

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Test method for ferroelectric memory von SCHMITZ THORSTEN, TIEDKE STEPHAN

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TEST METHOD FOR FERROELECTRIC MEMORIES von SCHMITZ, THORSTEN, TIEDKE, STEPHAN

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Electrometer for measuring fast voltage changes von SZOT, KRZYSZTOF, TIEDKE, STEPHAN

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Molekülpositioniereinrichtung von FEILBACH, HERBERT, WANDLOWSKI, THOMAS, SACHSENHAUSEN, HANS, KARTHAEUSER, SILVIA, SZOT, KRYSZTOF, TIEDKE, STEPHAN

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Device for contacting molecules with scanning tunnel microscope comprises stylus arranged opposite needle von FEILBACH, HERBERT, WANDLOWSKI, THOMAS, SACHSENHAUSEN, HANS, KARTHAEUSER, SILVIA, SZOT, KRYSZTOF, TIEDKE, STEPHAN

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METHOD AND DEVICE FOR CHARACTERIZING A SAMPLE BY MEANS OF DOUBLE-BEAM LASER INTERFEROMETRY von SCHMITZ-KEMPEN, THORSTEN, REICHENBERG, BERND, PRUME, KLAUS, TIEDKE, STEPHAN

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Verfahren und eine Vorrichtung für die Charakterisierung einer Probe mittels der Doppelstrahl-Laserinterferometrie von SCHMITZ-KEMPEN, THORSTEN, REICHENBERG, BERND, PRUME, KLAUS, TIEDKE, STEPHAN

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