Stress-Induced Off-Current under On- and Off-State Stress Voltages in Low-Temperature n-Channel Polycrystalline Silicon Thin-Film Transistors von Hirata, Seishiro, Satoh, Toshifumi, Tango, Hiroyuki

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In-situ observation of influence of metal types on wear process in dry conditions von Yagi, Kazuyuki, Tango, Hiroyuki, Izumi, Takashi, Tohyama, Mamoru, Saito, Koji, Sugimura, Joichi

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Hot-Carrier-Induced Degradation under Current Saturation Bias in p-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors von Yamagata, Masahiro, Satoh, Toshifumi, Tango, Hiroyuki

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On the universality of inversion layer mobility in Si MOSFET's: Part I-effects of substrate impurity concentration von Takagi, S., Toriumi, A., Iwase, M., Tango, H.

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Hot-Carrier Effect in Polycrystalline Silicon n-Channel Lightly Doped Drain Thin-Film Transistors with Low n - Impurity Concentration von Yamagata, Masahiro, Satoh, Toshifumi, Tango, Hiroyuki

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On the universality of inversion layer mobility in Si MOSFET's: Part II-effects of surface orientation von Takagi, S., Toriumi, A., Iwase, M., Tango, H.

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Hot-Carrier Degradation in Low-Temperature Polycrystalline Silicon n-Channel Lightly Doped Drain Thin-Film Transistors von Hirata, Seishiro, Yamagata, Masahiro, Satoh, Toshifumi, Tango, Hiroyuki

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Hot-Carrier Degradation and Electric Field and Electron Concentration near Drain Junction in Low-Temperature N-Channel Single Drain and Lightly Doped Drain Polycrystalline Silicon... von Usami, Gen, Nogami, Yukisato, Yajima, Toshihisa, Yamagata, Masahiro, Satoh, Toshifumi, Tango, Hiroyuki

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Tow-Dimensional Simulation of Electric Field and Carrier Distribution of Low-Temperature n-Channel Poly-Si TFTs von Nogami, Yukisato, Satoh, Toshihumi, Tango, Hiroyuki

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Improvement of SOS Device Performance by Solid-Phase Epitaxy von Yoshii, Toshio, Taguchi, Shinji, Inoue, Tomoyasu, Tango, Hiroyuki

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Two-dimensional simulation and measurement of high-performance MOSFETs made on a very thin SOI film von Yoshimi, M., Hazama, H., Takahashi, M., Kambayashi, S., Wada, T., Tango, H.

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A 4K CMOS/SOS Static RAM using Weak Depletion Type Lambda-Diode Cells von Iizuka, Tetsuya, Ohtani, Takayuki, Sato, Tai, Tango, Hiroyuki

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A low driving voltage CCD with single layer electrode structure for area image sensor von Tanaka, N., Nakamura, N., Matsunaga, Y., Manabe, S., Tango, H., Yoshida, O.

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Analysis of signal to noise ratio of photoconductive layered solid-state imaging device von Matsunaga, Y., Hatori, F., Tango, H., Yoshida, O.

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Analisys of Incomplete Transfer Noise of “Two Level” CCD Image Sensor von Shioyama, Yoshiyuki, Matsunaga, Yoshiyuki, Hatori, Fumitoshi, Tango, Hiroyuki, Yoshida, Okio

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Improvement of surface morphology and bulk structure of a-SiC:H films von Ishizuka, Yoshiki, Yamaguchi, Tetsuya, Iida, Yoshinori, Nozaki, Hidetoshi, Furukawa, Akihiko, Tango, Hiroyuki, Yoshida, Okio

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Electric field concentration at electrode edge with decreasing amorphous silicon defect density von Ihara, Hisanori, Oba, Eiji, Iida, Yoshinori, Nozaki, Hidetoshi, Wada, Tetsunori, Furukawa, Akihiko, Manabe, Sohei, Tango, Hiroyuki, Yoshida, Okio

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Analysis of photoelectric conversion characteristics under knee control operation for CCD imagers von Nakamura, N., Matsunaga, Y., Egawa, Y., Endo, R., Tango, H., Yoshida, O.

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A high speed and low power CMOS/SOS multiplier-accumulator von Iwamura, Jun, Taguchi, Shinji, Kazuo, Suganuma, Minoru, Kimura, Hiroyuki, Tango, Kazuaki, Ichinose, Tai, Sato

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Characteristics of a-Si:H films prepared by a novel laminar flow photo-chemical vapor deposition method von Yamaguchi, Tetsuya, Iida, Yoshinori, Furukawa, Akihiko, Ishizuka, Yoshiki, Nozaki, Hidetoshi, Manabe, Sohei, Tango, Hiroyuki, Yoshida, Okio

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