Depth sensitivity of atomic resolution secondary electron imaging von Saitoh, Koh, Tamaki, Hirokazu

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Full-field illumination ptychography with a structured electron beam von Tamaki, Hirokazu, Saitoh, Koh

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炭素鋼 S45C の片振り疲労寿命に及ぼす圧縮予歪の影響 von 玉木, 裕和, 北澤, 留弥, 吉田, 誠, 堀部, 進

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Influence of Compressive Pre-Strain on Tensile Fatigue Life in Carbon Steel S45C von Tamaki, Hirokazu, Kitazawa, Rumi, Yoshida, Makoto, Horibe, Susumu

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Charged Particle Beam System von TAMAKI, Hirokazu

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Charged Particle Beam System von TAMAKI, Hirokazu, MISE, Hiromi

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ABERRATION CORRECTOR AND ELECTRON MICROSCOPE von KUBO, Yudai, TAMAKI, Hirokazu

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STRAHLVORRICHTUNG FÜR GELADENE TEILCHEN von Takasaki, Mihiro, Tamaki, Hirokazu

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ABERRATIONSKORREKTOR UND ELEKTRONENMIKROSKOP von Kubo, Yudai, Tamaki, Hirokazu

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CHARGED PARTICLE BEAM DEVICE AND CONTROL METHOD THEREOF von Dobashi, Takashi, Mise, Hiromi, Tamaki, Hirokazu

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CHARGED PARTICLE BEAM SYSTEM von TAMAKI, Hirokazu

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Charged particle beam device and spherical aberration correction method von Tamaki Hirokazu, Hirayama Yoichi

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CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR CONTROLLING CHARGED PARTICLE BEAM APPARATUS von DOBASHI, Takashi, TAMAKI, Hirokazu, MISE, Hiromi, ITO, Shuntaro

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하전 입자선 시스템 및 하전 입자선 장치의 제어 시스템에 의해 실행되는 방법 von TAMAKI HIROKAZU, MISE HIROMI

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CHARGED PARTICLE RAY SYSTEM, AND METHOD TO BE IMPLEMENTED BY CONTROL SYSTEM OF CHARGED PARTICLE RAY APPARATUS von TAMAKI Hirokazu, MISE Hiromi

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Bilateral Microphthalmos with Orbital Cyst: Case Report von YOSHIHARA, Masaaki, ISHIZAWA, Atsushi, SATO, Kiyoshi, TAMAKI, Hirokazu

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Charged particle beam device for moving an aperture having plurality of openings and sample observation method von Kikuchi, Hideki, Watanabe, Keitaro, Dobashi, Takashi, Tamaki, Hirokazu, Taniguchi, Yoshifumi, Hanawa, Akinari, Yaguchi, Toshie

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Measurement System and Method for Setting Observation Conditions of Measurement Apparatus von DOBASHI, Takashi, SAKAKIBARA, Makoto, KURATA, Sayaka, PARK, Minseok, TAMAKI, Hirokazu, SHIRASAKI, Yasuhiro, SHINTANI, Atsuko, ENYAMA, Momoyo, KAGATSUME, Akiko, KRASIENAPIBAL, Thantip, MIWA, Takafumi, URANO, Kotoko

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ELECTRON MICROSCOPE AND IMAGING METHOD von TANIGUCHI, Yoshifumi, HARADA, Ken, KASAI, Hiroto, TAMAKI, Hirokazu, YOTSUJI, Takafumi, YAGUCHI, Toshie, TAMURA, Keiji

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CHARGED PARTICLE BEAM APPARATUS, AND METHOD FOR CONTROLLING SAME von DOBASHI, Takashi, TAMAKI, Hirokazu, MISE, Hiromi

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