Structural Study on Amorphous Tellurium Using Reverse Monte Carlo Simulation von Kohzu, Kaoru, Taketoshi, Kazuhisa

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Structural studies on silicon ditelluride (SiTe2) von TAKETOSHI, K, ANDOH, F

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Novel digital photosensor cell in GaAs IC using conversion of light intensity to pulse frequency von TANAKA, K, ANDO, F, TAKETOSHI, K, OHISHI, I, ASARI, G

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Excess noise in amorphous selenium avalanche photodiodes von OHSHIMA, T, TSUJI, K, SAMESHIMA, K, HIRAI, T, SHIDARA, K, TAKETOSHI, K

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Analysis of the correlative characteristics between adjacent pixels of amplified metal oxide semiconductor imager by a new-type least squares method von TAKETOSHI, K, ANDOH, F, TANAKA, K, IMAI, M

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The noise reduction effect of the amplified metal oxide semiconductor imager von ANDOH, F, TANIWAKI, R, TAKETOSHI, K, ARAKI, S

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Studies on ionization coefficients of targets in an amorphous selenium APD for pick-up tubes by new type least squares von TAKETOSHI, K, TANIOKA, K, KAWAMURA, T

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Study of Ring-to-chain Structural Change of Evaporated Amorphous Selenium by Reverse Monte Carlo Simulation von SAITO, Hitoshi, TAKETOSHI, Kazuhisa, KOZU, Kaoru

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Studies of multiplication process of a novel image intensifier of an amplified metal-oxide-semiconductor imager overlaid with electron-bombarded amorphous silicon von Taketoshi, K., Andoh, F.

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Development of an Electron Diffractometer Using an Electron-bombarded Amplified MOS Imager von SAITO, Hitoshi, TAKETOSHI, Kazuhisa, KOZU, Kaoru, SATO, Kunitaka

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Development of a Novel Evaporator Using a Source Electrode with a Liquid Contact Exchangeable via a Pre-Evacuation Chamber von TAKETOSHI, Kazuhisa, ANDOH, Fumihiko

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Analyses of noise in a highly sensitive image device von TAKETOSHI, K, TANIOKA, K, ANDOH, F, YAMAZAKI, J, TAKASAKI, Y

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An avalanche-mode amorphous Selenium photoconductive layer for use as a camera tube target von Tanioka, K., Yamazaki, J., Shidara, K., Taketoshi, K., Kawamura, T., Ishioka, S., Takasaki, Y.

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Study of Amorphous Gallium Arsenide Films Using a Novel Evaporator with Nondestructive Pickup Image and Electron Diffraction Pattern Investigations von TAKETOSHI, Kazuhisa, SAITO, Hitoshi, TAKEMOTO, Masuo, ANDOH, Fumihiko, SHIMOMOTO, Yasuharu

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An Analysis of Fixed Pattern Noise (FPN) for the Amplified MOS Intelligent Imager von Ando, Fumihiko, Sugawara, Masayuki, Taketoshi, Kazuhisa, Miyata, Kenji

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JPS6159526B von TAKETOSHI KAZUHISA

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JPS5849037B von TAKETOSHI KAZUHISA

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Exchangeable Ga-Cu electrode for an evaporation system von TAKETOSHI, KAZUHISA

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Ga-Cu alloy for use in exchangeable electrode for an evaporation system von TAKETOSHI, KAZUHISA

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MANUFACTURE OF AMORPHOUS GAAS THIN FILM AND MANUFACTURE OF AMORPHOUS GAAS TFT von TAKETOSHI KAZUHISA, SHIMOMOTO TAIJI

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