Microplastics and Potentially Toxic Elements: Potential Human Exposure Pathways through Agricultural Lands and Policy Based Countermeasures von Igalavithana, Avanthi Deshani, Mahagamage, Mahagama Gedara Y. L., Gajanayake, Pradeep, Abeynayaka, Amila, Gamaralalage, Premakumara Jagath Dickella, Ohgaki, Masataka, Takenaka, Miyuki, Fukai, Takayuki, Itsubo, Norihiro

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Application of X-ray Absorption Fine Structure Method for the Quantitative Analysis of Hexavalent Chromium in Chromate Conversion Coating and Plastic von Oki, Mitsuhiro, Morimoto, Sayaka, Muramatsu, Miho, Yoshiki, Masahiko, Takenaka, Miyuki

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Rapid analysis of polybrominated diphenyl ethers by ion attachment mass spectrometry von Sato, Yuka, Oki, Mitsuhiro, Kondo, Asato, Takenaka, Miyuki, Satake, Hideki

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Accurate depth profiling for ultra-shallow implants using backside-SIMS von Hongo, Chie, Tomita, Mitsuhiro, Takenaka, Miyuki

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Feeding unsaponifiable compounds from rice bran oil does not alter hepatic mRNA abundance for cholesterol metabolism-related proteins in hypercholesterolemic rats von Nagao, K. (Kyushu Univ., Fukuoka (Japan)), Sato, M, Takenaka, M, Ando, M, Iwamoto, M, Imaizumi, K

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Test Method for the Presence or Absence of Pb in Electrical Components Using Energy-Dispersive Micro X-ray Fluorescence von ARAKI, Wakako, MIZOROKI, Kaoru, OKI, Mitsuhiro, TAKENAKA, Miyuki

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Evaluation of a Mirror-Polishing Technique for Fluorocarbon Polymer Surfaces for Reduction of Contamination from Containers Used in Ultratrace Analysis von Takenaka, Miyuki, Hayashi, Masaru, Suzuki, Isao, Yamada, Yuji, Takamatsu, Koji, Kageyama, Mokuji

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Determination of Uranium and Thorium in Aluminum by Inductively Coupled Plasma Mass Spectrometry von KOZUKA, Shoji, YAMADA, Yuji, TAKENAKA, Miyuki, HAYASHI, Masaru, MATSUNAGA, Hideki

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Evaluation of ultratrace metallic impurities in thin copper layers, barrier metals and silicon wafers for copper metallization technology von TAKENAKA, M, TACHIBE, T, KOZUKA, S, HAYASHI, M, MATSUNAGA, H

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Basic Studies of Ultratrace Chemical Analysis for Metallic Elements in Several Semiconductor Materials von TAKENAKA, Miyuki

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Accurate depth profiling for ultra-shallow implants using backside-SIMS von CHIE HONGO, TOMITA, Mitsuhiro, TAKENAKA, Miyuki

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Backside-SIMS profiling of dopants in thin Hf silicate film von Hongo, Chie, Takenaka, Miyuki, Kamimuta, Yuuichi, Suzuki, Masamichi, Koyama, Masato

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Determination of ultratrace metallic impurities in silicon wafers by acid vapor decomposition/electrothermal vapolization ICP-MS von TAKENAKA, Miyuki, YAMADA, Yuji, HAYASHI, Masaru, OMORI, Hirohumi, ITO, Syoko, OKADA, Akira

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METHOD FOR QUANTITATIVE ANALYSIS OF METAL ELEMENT CONTAINED IN RESIN MATERIAL von TAKENAKA, MIYUKI

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Determination of ultratrace sodium, potassium and iron in photoresist by graphite furnace AAS after several sample treatment procedures von TAKENAKA, M, KOZUKA, S, HASHIMOTO, Y

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Depth profiling of ultratrace chromium, iron, nickel, and copper in silicon wafers by electrothermal vaporization/ICP-MS von TAKENAKA, Miyuki, TOMITA, Mitsuhiro, KUBOTA, Atsuko, TSUCHIYA, Norihiko, MATSUNAGA, Hideki

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Method for quantitative analysis of metal element contained in resin material von Takenaka, Miyuki

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Method for quantitative analysis of metal element contained in resin material von TAKENAKA MIYUKI

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Determination of ultratrace metallic impurities in polysilane and siloxane polymers for microelectronic devices von Takenaka, Miyuki, Yamada, Yuji, Kozuka, Shoji

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Determination of airborne organic contaminants in clean-room air by silicon powder adsorption-solvent extraction-GC/MS analysis von SATO, Yuka, SAKAI, Kimito, TAMAOKI, Makiko, TAKENAKA, Miyuki

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