XPS study of the surface chemistry of L-CVD SnO2 thin films after oxidation von KWOKA, M, OTTAVIANO, L, PASSACANTANDO, M, SANTUCCI, S, CZEMPIK, G, SZUBER, J

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Surface properties of SnO2 nanolayers prepared by spin-coating and thermal oxidation von Kwoka, M, Lyson-Sypien, B, Comini, E, Krzywiecki, M, Waczynski, K, Szuber, J

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XPS and AFM studies of surface chemistry and morphology of In2O3 ultrathin films deposited by rheotaxial growth and vacuum oxidation von KOSCIELNIAK, P, MAZUR, J, HENEK, J, KWOKA, M, PAWELA, L, SZUBER, J

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Comparative analysis of physico-chemical and gas sensing characteristics of two different forms of SnO2 films von Kwoka, M, Ottaviano, L, Szuber, J

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XPS study of the L-CVD deposited SnO2 thin films exposed to oxygen and hydrogen von SZUBER, J, CZEMPIK, G, LARCIPRETE, R, KOZIEJ, D, ADAMOWICZ, B

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Photoemission studies of the surface electronic properties of L-CVD SnO2 ultra thin films von Kwoka, M., Ottaviano, L., Szuber, J.

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Comparative study of surface morphology of copper phthalocyanine ultra thin films deposited on Si (111) native and RCA-cleaned substrates von Krzywiecki, M., Grządziel, L., Bodzenta, J., Szuber, J.

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X-ray photoelectron spectroscopy and thermal desorption spectroscopy comparative studies of L-CVD SnO2 ultra thin films von KWOKA, M, WACZYNSKA, N, KOSCIELNIAK, P, SITARZ, M, SZUBER, J

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Spectroscopic insights into CO sensing of undoped and palladium doped tin dioxide sensors derived from hydrothermally treated tin oxide sol von Koziej, D., Bârsan, N., Shimanoe, K., Yamazoe, N., Szuber, J., Weimar, U.

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AFM study of the surface morphology of L-CVD SnO2 thin films von KWOKA, M, OTTAVIANO, L, SZUBER, J

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Influence of ambient air exposure on surface chemistry and electronic properties of thin copper phthalocyanine sensing layers von Grządziel, L., Krzywiecki, M., Peisert, H., Chassé, T., Szuber, J.

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The effect of Si substrate preparation on surface morphology and surface composition of In2O3 ultrathin films deposited by rheotaxial growth and vacuum oxidation von Kościelniak, P., Sitarz, M., Maciak, E., Szuber, J.

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XPS depth profiling studies of L-CVD SnO2 thin films von KWOKA, M, OTTAVIANO, L, PASSACANTANDO, M, SANTUCCI, S, SZUBER, J

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Local surface morphology and chemistry of SnO2 thin films deposited by rheotaxial growth and thermal oxidation method for gas sensor application von OTTAVIANO, L, KWOKA, M, BISTI, F, PARISSE, P, GROSSI, V, SANTUCCI, S, SZUBER, J

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Influence of Si substrate preparation on surface chemistry and morphology of L-CVD SnO2 thin films studied by XPS and AFM von KWOKA, M, OTTAVIANO, L, WACZYNSKA, N, SANTUCCI, S, SZUBER, J

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X-ray Photoelectron Spectroscopy characterization of native and RCA-treated Si (111) substrates and their influence on surface chemistry of copper phthalocyanine thin films von Krzywiecki, M., Grządziel, L., Peisert, H., Biswas, I., Chassé, T., Szuber, J.

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XPS study of the surface chemistry of Ag-covered L-CVD SnO2 thin films von Kwoka, M., Ottaviano, L., Passacantando, M., Czempik, G., Santucci, S., Szuber, J.

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Comparative study of the GaAs(1 0 0) surface cleaned by atomic hydrogen von Tomkiewicz, P., Winkler, A., Szuber, J.

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On the correlation between morphology and electronic properties of copper phthalocyanine (CuPc) thin films von Grządziel, L., Żak, J., Szuber, J.

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Retraction notice to “Comparative analysis of physico-chemical and gas sensing characteristics of two different forms of SnO2 films [Appl. Surf. Sci. 326 (2014) 27–31] von Kwoka, M., Ottaviano, L., Szuber, J.

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