Measurement of InAsSb bandgap energy and InAs/InAsSb band edge positions using spectroscopic ellipsometry and photoluminescence spectroscopy von Webster, P. T., Riordan, N. A., Liu, S., Steenbergen, E. H., Synowicki, R. A., Zhang, Y.-H., Johnson, S. R.

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Atomic layer deposition of LiF using LiN(SiMe3)2 and SF6 plasma von Hornsveld, N., Kessels, W. M. M., Synowicki, R. A., Creatore, M.

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Transparent polycrystalline Gd2Hf2O7 ceramics von Chen, Ching‐Fong, Brennecka, Geoff L., Synowicki, R. A., Tegtmeier, Eric L., Brand, Michael J., Montalvo, J. D., Ivy, Jacob, Cherepy, Nerine J., Seeley, Zach, Payne, Steven A.

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Spectroscopic ellipsometry characterization of indium tin oxide film microstructure and optical constants von Synowicki, R.A

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Atomic layer deposition of LiF using LiN(SiMe 3 ) 2 and SF 6 plasma von Hornsveld, N, Kessels, W M M, Synowicki, R A, Creatore, M

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Suppression of backside reflections from transparent substrates von Synowicki, R. A.

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Absorption properties of type-II InAs/InAsSb superlattices measured by spectroscopic ellipsometry von Webster, P. T., Riordan, N. A., Liu, S., Steenbergen, E. H., Synowicki, R. A., Zhang, Y.-H., Johnson, S. R.

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Rare-Earth Monopnictide Alloys for Tunable, Epitaxial, Designer Plasmonics von Krivoy, E. M, Vasudev, A. P, Rahimi, S, Synowicki, R. A, McNicholas, K. M, Ironside, D. J, Salas, R, Kelp, G, Jung, D, Nair, H. P, Shvets, G, Akinwande, D, Lee, M. L, Brongersma, M. L, Bank, S. R

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Design and Testing of a Multivariate Optical Element: The First Demonstration of Multivariate Optical Computing for Predictive Spectroscopy von Soyemi, O, Eastwood, D, Zhang, L, Li, H, Karunamuni, J, Gemperline, P, Synowicki, R. A, Myrick, M. L

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Optical constants of electroplated gold from spectroscopic ellipsometry von Synowicki, R.A., Herzinger, Craig M., Hall, James T., Malingowski, Andrew

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Atomic layer deposition of LiF using LiN(SiMe) and SF plasma von Hornsveld, N, Kessels, W. M. M, Synowicki, R. A, Creatore, M

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Design and Testing of a Multivariate Optical Element:  The First Demonstration of Multivariate Optical Computing for Predictive Spectroscopy von Soyemi, O, Eastwood, D, Zhang, L, Li, H, Karunamuni, J, Gemperline, P, Synowicki, R. A, Myrick, M. L

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Atomic layer deposition of aluminum fluoride using Al(CH3)3 and SF6 plasma von Vos, M. F. J., Knoops, H. C. M., Synowicki, R. A., Kessels, W. M. M., Mackus, A. J. M.

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Polydimethylsiloxane: Optical properties from 191 to 1688 nm (0.735–6.491 eV) of the liquid material by spectroscopic ellipsometry von Roychowdhury, Tuhin, Cushman, Cody V., Synowicki, R. A., Linford, Matthew R.

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Transparent polycrystalline Gd 2 Hf 2 O 7 ceramics von Chen, Ching‐Fong, Brennecka, Geoff L., Synowicki, R. A., Tegtmeier, Eric L., Brand, Michael J., Montalvo, J. D., Ivy, Jacob, Cherepy, Nerine J., Seeley, Zach, Payne, Steven A.

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Mueller matrix ellipsometry study of uniaxial deuterated potassium dihydrogen phosphate (DKDP) von Synowicki, R.A., Hilfiker, James N., Whitman, Pamela K.

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Structural, electrical, and optical properties of thermally evaporated nanocrystalline PbTe films von Wang, Jianfei, Hu, Juejun, Sun, Xiaochen, Agarwal, Anuradha M., Kimerling, Lionel C., Lim, Desmond R., Synowicki, R. A.

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Thin film materials exposure to low Earth orbit aboard Space Shuttle von Synowicki, R. A, Hale, Jeffrey S, Spady, Blaine, Reiser, Mike, Nafis, S, Woollam, John A

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Microstructural characterization of SiOx surface contaminants on ashed aluminum thin films von SYNOWICKI, R. A, HALE, J. S, KUBIK, R. D, NAFIS, S, WOOLLAM, J. A

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Optical constants of (Al0.98Ga0.02)xOy native oxides von Knopp, K. J., Mirin, R. P., Christensen, D. H., Bertness, K. A., Roshko, A., Synowicki, R. A.

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