New Review Articles von Sacks, Michael S., Swanson, John A.

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Caffeine and nicotine: A review of their joint use and possible interactive effects in tobacco withdrawal von Swanson, John A., Lee, Jerry W., Hopp, Joyce W.

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The impact of caffeine use on tobacco cessation and withdrawal von Swanson, John A., Lee, Jerry W., Hopp, Joyce W., Berk, Lee S.

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Special Issue von Sacks, Michael S., Gleason, Rudolph

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Automatic elimination of noise for big data analytics von Singh, Vivek K, Swanson, John A, Sastry, Kumara, Chen, I-Tzu, Parks, Helen F

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Fill pattern to enhance ebeam process margin von Swanson, John A, Ogadhoh, Shem O, Phillips, Mark C, Tandon, Shakul

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Unsupervised clustering to identify anomalies von Chang, Lillian, Singh, Vivek K, Swanson, John A, Sastry, Kumara, Swaroop, Manuj, Toh, Kenny K

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Using finite element analysis for continued product improvement von SWANSON, John A

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FILL PATTERN TO ENHANCE EBEAM PROCESS MARGIN von TANDON, Shakul, PHILLIPS, Mark C, SWANSON, John A, OGADHOH, Shem O

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Fill pattern to enhance e-beam process margin von Swanson, John A, Ogadhoh, Shem O, Phillips, Mark C, Tandon, Shakul

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Fast pattern matching von Singh, Vivek K, Swanson, John A, Atkar, Prasad N, Sreedhar, Aswin, Baidya, Bikram

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Image morphing to meet desired constraints in geometric patterns von Singh, Vivek K, Swanson, John A, Baidya, Bikram, Erten, Hale, Yang-Flint, Mengfei, Kagalwalla, Abde Ali Hunaid, Gu, Allan

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Random forest model for prediction of chip layout attributes von Singh, Vivek K, Swanson, John A, Sastry, Kumara, Atkar, Prasad N, Baidya, Bikram

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AUTOMATIC ELIMINATION OF NOISE FOR BIG DATA ANALYTICS von Singh, Vivek K, Swanson, John A, Sastry, Kumara, Chen, I-Tzu, Parks, Helen F

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Defective artifact removal in photolithography masks corrected for optical proximity von SWANSON JOHN A, WAGNER STEPHAN

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DEFECTIVE ARTIFACT REMOVAL IN PHOTOLITHOGRAPHY MASKS CORRECTED FOR OPTICAL PROXIMITY von SWANSON JOHN A, WAGNER STEPHAN

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ADAPTIVE ALGORITHM TO GENERATE OPTICAL PROXIMITY CORRECTION LITHOGRAPHIC RECIPE von Singh, Vivek K, Swanson, John A, Sastry, Kumara, Mukhopadhyay, Saumyadip, Vasudevan, Kasyap Thottasserymana, Auluck, Kshitij

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UNSUPERVISED CLUSTERING TO IDENTIFY ANOMALIES von Chang, Lillian, Singh, Vivek K, Swanson, John A, Sastry, Kumara, Swaroop, Manuj, Toh, Kenny K

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RANDOM FOREST MODEL FOR PREDICTION OF CHIP LAYOUT ATTRIBUTES von Singh, Vivek K, Swanson, John A, Sastry, Kumara, Atkar, Prasad N, Baidya, Bikram

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Diode Theory in the Light of Hole Injection von Swanson, John A.

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