The role of boron related defects in limiting charge carrier lifetime in 4H–SiC epitaxial layers von Ghezellou, Misagh, Kumar, Piyush, Bathen, Marianne E., Karsthof, Robert, Sveinbjörnsson, Einar Ö., Grossner, Ulrike, Bergman, J. Peder, Vines, Lasse, Ul-Hassan, Jawad

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CVD growth and properties of on-axis vanadium doped semi-insulating 4H-SiC epilayers von Karhu, Robin, Sveinbjörnsson, Einar Ö., Magnusson, Björn, Ivanov, Ivan G., Danielsson, Örjan, Ul Hassan, Jawad

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Observations of very fast electron traps at SiC/high-κ dielectric interfaces von Vidarsson, Arnar M., Persson, Axel R., Chen, Jr-Tai, Haasmann, Daniel, Hassan, Jawad Ul, Dimitrijev, Sima, Rorsman, Niklas, Darakchieva, Vanya, Sveinbjörnsson, Einar Ö.

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Room temperature electroluminescence from dislocation-rich silicon von Sveinbjörnsson, Einar Ö., Weber, Jörg

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Electrical Characterization of MOCVD Grown Single Crystalline AlN Thin Films on 4H-SiC von Karhu, Robin, Khosa, Rabia Y., Chen, J.T., Rorsman, Niklas, Hassan, Jawad, Pálsson, K., Sveinbjörnsson, E.Ö.

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Detection of near-interface traps in NO annealed 4H-SiC metal oxide semiconductor capacitors combining different electrical characterization methods von Vidarsson, Arnar M., Nicholls, Jordan R., Haasmann, Daniel, Dimitrijev, Sima, Sveinbjörnsson, Einar Ö.

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Trap and Inversion Layer Mobility Characterization Using Hall Effect in Silicon Carbide-Based MOSFETs With Gate Oxides Grown by Sodium Enhanced Oxidation von Tilak, V., Matocha, K., Dunne, G., Allerstam, F., Sveinbjornsson, E.O.

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Interfaces between 4H-SiC and SiO2: Microstructure, nanochemistry, and near-interface traps von Pippel, Eckhard, Woltersdorf, Jörg, Ólafsson, Halldor Ö., Sveinbjörnsson, Einar Ö.

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Carrier Lifetime Controlling Defects Z 1/2 and RB1 in Standard and Chlorinated Chemistry Grown 4H-SiC von Booker, Ian D., Hassan, Jawad Ul, Lilja, Louise, Beyer, Franziska C., Karhu, Robin, Bergman, J. Peder, Danielsson, Örjan, Kordina, Olof, Sveinbjörnsson, Einar Ö., Janzén, Erik

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Improvement of channel-carrier mobility in 4H-SiC MOSFETs correlated with passivation of very fast interface traps using sodium enhanced oxidation von Vidarsson, Arnar M., Haasmann, Daniel, Dimitrijev, Sima, Sveinbjörnsson, Einar Ö.

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A method for characterizing near-interface traps in SiC metal–oxide–semiconductor capacitors from conductance–temperature spectroscopy measurements von Nicholls, Jordan R., Vidarsson, Arnar M., Haasmann, Daniel, Sveinbjörnsson, Einar Ö., Dimitrijev, Sima

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Influence of Field Plates and Surface Traps on Microwave Silicon Carbide MESFETs von Nilsson, P.-A., Allerstam, F., Sudow, M., Andersson, K., Hjelmgren, H., Sveinbjornsson, E.O., Rorsman, N.

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Design and Fabrication of 4H-SiC RF MOSFETs von Gudjonsson, G.I., Allerstam, F., Sveinbjornsson, E.O., Hjelmgren, H., Nilsson, P.-A., Andersson, K., Zirath, H., Rodle, T., Jos, R.

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Observation of interface defects in thermally oxidized SiC using positron annihilation von Dekker, James, Saarinen, Kimmo, Ólafsson, Halldór, Sveinbjörnsson, Einar Ö.

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Deep Traps in 4H-SiC MOS Capacitors Investigated by Deep Level Transient Spectroscopy von Sveinbjornsson, Einar O, Gislason, Olafur

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Near-Interface Trap Model for the Low Temperature Conductance Signal in SiC MOS Capacitors With Nitrided Gate Oxides von Nicholls, Jordan R., Vidarsson, Arnar M., Haasmann, Daniel, Sveinbjornsson, Einar O., Dimitrijev, Sima

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Conductance signal from near-interface traps in n-type 4H-SiC MOS capacitors under strong accumulation von Khosa, R. Y., Sveinbjornsson, E. O.

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Enhanced Mobility in InAlN/AlN/GaN HEMTs Using a GaN Interlayer von Malmros, Anna, Chen, Jr-Tai, Hjelmgren, Hans, Lu, Jun, Hultman, Lars, Kordina, Olof, Sveinbjornsson, Einar O., Zirath, Herbert, Rorsman, Niklas

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Low Density of Near-Interface Traps at the Al2O3/4H-SiC Interface with Al2O3 Made by Low Temperature Oxidation of Al von Winters, Michael, Karhu, Robin, Janzén, Erik, Khosa, Rabia Y., Rorsman, Niklas, Hassan, Jawad, Sveinbjörnsson, E.Ö.

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Strong reduction in the density of interface states at the SiO 2 /4H-SiC interface after oxidation in the presence of alkali ions von Hermannsson, Pétur Gordon, Sveinbjörnsson, Einar Ö

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