Treffer 1 - 11 von 11 für Suche 'Sungno Lee', Suchdauer: 0,49s Treffer weiter einschränken
  1. 1
    Real-time monitoring of plasma flickering in high pressure electronegative discharge

    Real-time monitoring of plasma flickering in high pressure electronegative discharge von Yongjin Kim, Kyehyun Baek, Samhae Lee, Sungno Lee, Jaewook Lee, Yeonhong Jee, Changjin Kang, Hanku Cho, Jootae Moon


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  2. 2
    Analog-to-digital conversion circuit and receiver including same

    Analog-to-digital conversion circuit and receiver including same von Baek, Seungyeob, Lee, Sungno, Choi, Michael, Hwang, Heechang, Shin, Hyochul

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    Patent

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  3. 3
    Analog-to-digital conversion circuit and receiver including same

    Analog-to-digital conversion circuit and receiver including same von Moon, Kyoungjun, Lee, Sungno, Choi, Michael, Hwang, Heechang, Shin, Hyochul, Lee, Yongki

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  4. 4
    ANALOG-TO-DIGITAL CONVERSION CIRCUIT AND RECEIVER INCLUDING SAME

    ANALOG-TO-DIGITAL CONVERSION CIRCUIT AND RECEIVER INCLUDING SAME von BAEK, SEUNGYEOB, LEE, SUNGNO, CHOI, MICHAEL, SHIN, HYOCHUL, HWANG, HEECHANG

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    Patent

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  5. 5
    Built-in self-test circuits and semiconductor integrated circuits including the same

    Built-in self-test circuits and semiconductor integrated circuits including the same von Lee, Heejune, Lee, Sungno, Choi, Michael, Park, Jinwoo, Oh, Eunhye, Cho, Youngjae, Park, Younghyo

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  6. 6
    ANALOG-TO-DIGITAL CONVERSION CIRCUIT AND RECEIVER INCLUDING SAME

    ANALOG-TO-DIGITAL CONVERSION CIRCUIT AND RECEIVER INCLUDING SAME von LEE, SUNGNO, CHOI, MICHAEL, HWANG, HEECHANG, SHIN, HYOCHUL, LEE, YONGKI, MOON, KYOUNGJUN

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    Patent

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  7. 7
    Semiconductor integrated circuit and method of testing the same

    Semiconductor integrated circuit and method of testing the same von Lee, Heejune, Lee, Sungno, Choi, Michael, Park, Jinwoo, Oh, Eunhye, Shin, Hyochul, Cho, Youngjae, Lee, Yongki, Park, Younghyo

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  8. 8
    BUILT-IN SELF-TEST CIRCUITS AND SEMICONDUCTOR INTEGRATED CIRCUITS INCLUDING THE SAME

    BUILT-IN SELF-TEST CIRCUITS AND SEMICONDUCTOR INTEGRATED CIRCUITS INCLUDING THE SAME von Lee, Heejune, Lee, Sungno, Choi, Michael, Park, Jinwoo, Oh, Eunhye, Cho, Youngjae, Park, Younghyo

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  9. 9
    SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF TESTING THE SAME

    SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF TESTING THE SAME von Lee, Heejune, Lee, Sungno, Choi, Michael, Park, Jinwoo, Oh, Eunhye, Shin, Hyochul, Cho, Youngjae, Lee, Yongki, Park, Younghyo

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  10. 10
    Analog-Digital-Umwandlungsschaltung und Empfänger mit derselben

    Analog-Digital-Umwandlungsschaltung und Empfänger mit derselben von Baek, Seungyeob, Lee, Sungno, Choi, Michael, Hwang, Heechang, Shin, Hyochul

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  11. 11
    Analog-Digital-Umwandlungsschaltung und Empfänger mit derselben

    Analog-Digital-Umwandlungsschaltung und Empfänger mit derselben von Moon, Kyoungjun, Lee, Sungno, Choi, Michael, Hwang, Heechang, Shin, Hyochul, Lee, Yongki

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