Giant second-harmonic generation in ferroelectric NbOI2 von Abdelwahab, I, Tilmann, B, Wu, Y, Giovanni, D, Verzhbitskiy, I, Zhu, M, Berté, R, Xuan, F, Menezes, LDS, Eda, G, Sum, TC, Quek, SY, Maier, SA, Loh, KP

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Proton beam writing of low-loss polymer optical waveguides von Sum, T. C., Bettiol, A. A., van Kan, J. A., Watt, F., Pun, E. Y. B., Tung, K. K.

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Erbium-doped waveguide amplifiers fabricated using focused proton beam writing von Liu, K., Pun, E. Y. B., Sum, T. C., Bettiol, A. A., van Kan, J. A., Watt, F.

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Fabrication of optical waveguides using proton beam writing von Bettiol, A.A., Venugopal Rao, S., Sum, T.C., van Kan, J.A., Watt, F.

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A progress review of proton beam writing applications in microphotonics von Bettiol, A.A., Sum, T.C., Cheong, F.C., Sow, C.H., Venugopal Rao, S., van Kan, J.A., Teo, E.J., Ansari, K., Watt, F.

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Proton beam writing of passive waveguides in PMMA von Sum, T.C., Bettiol, A.A., Seng, H.L., Rajta, I., van Kan, J.A., Watt, F.

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Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope von Sum, T. C., Bettiol, A. A., Seng, H. L., Kan, J. A. van, Watt, F.

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Efficacious symmetry-adapted atomic displacement method for lattice dynamical studies von Gan, CK, Liu, Y, Sum, TC, Hippalgaonkar, K

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Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy von Sum, T. C., Bettiol, A. A., van Kan, J. A., Venugopal Rao, S., Watt, F., Liu, K., Pun, E. Y. B.

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Proton beam writing of erbium-doped waveguide amplifiers von Sum, T.C., Bettiol, A.A., Liu, K., Ren, M.Q., Pun, E.Y.B., Venugopal Rao, S., van Kan, J.A., Watt, F.

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A LabVIEW™-based scanning and control system for proton beam micromachining von Bettiol, Andrew A., van Kan, J.A., Sum, T.C., Watt, F.

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Proton beam micromachining: a new tool for precision three-dimensional microstructures von van Kan, J.A., Bettiol, A.A., Wee, B.S., Sum, T.C., Tang, S.M., Watt, F.

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Fabrication of micro-optical components in polymer using proton beam micro-machining and modification von Bettiol, A.A., Sum, T.C., van Kan, J.A., Watt, F.

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Probing the SiGe virtual substrate by high-resolution channeling contrast microscopy von Seng, H. L., Osipowicz, T., Sum, T. C., Tok, E. S., Breton, G., Woods, N. J., Zhang, J.

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The use of proton microbeams for the production of microcomponents von Osipowicz, T, van Kan, J.A, Sum, T.C, Sanchez, J.L, Watt, F

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Sub 100 nm proton beam micromachining: theoretical calculations on resolution limits von van Kan, J.A, Sum, T.C, Osipowicz, T, Watt, F

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High-resolution channeling contrast microscopy of compositionally graded Si1−XGeX layers von Seng, H.L., Osipowicz, T., Sum, T.C., Breese, M.B.H., Watt, F., Tok, E.S., Zhang, J.

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Micro-RBS study of nickel silicide formation von Seng, H.L., Osipowicz, T., Lee, P.S., Mangelinck, D., Sum, T.C., Watt, F.

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Intracranial multiple myeloma involving the dura von Tsang, Chi-Sum, Ho, L.C., Tan, Tze-Ching

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Outcome after stroke rehabilitation in Hong Kong von Sim, TC, Lum, CM, Sze, Frank K, Or, KH, Woo, J.

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