Recent improvements in the integration of field emitters into scanning probe microscopy sensors von Beuer, S., Rommel, M., Petersen, S., Amon, B., Sulzbach, Th, Engl, W., Bauer, A.J., Ryssel, H.

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Integration of field emitters into scanning probe microscopy sensors using focused ion and electron beams von Lehrer, C., Frey, L., Petersen, S., Ryssel, H., Schäfer, M., Sulzbach, Th

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Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining von Lehrer, C., Frey, L., Petersen, S., Sulzbach, Th, Ohlsson, O., Dziomba, Th, Danzebrink, H.U., Ryssel, H.

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Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM) von Dziomba, Th, Sulzbach, Th, Ohlsson, O., Lehrer, Ch, Frey, L., Danzebrink, H. U.

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Piezoresistive bridge configuration for atomic force microscopy von Jumpertz, R., van der Hart, A., Schelten, J., Ohlsson, O., Sulzbach, Th, Saurenbach, F.

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Integration of field emitters into scanning probe microscopy sensors using focused ion and electron beams von Lehrer, C., Frey, L., Schafer, M., Sulzbach, T., Petersen, S., Ryssel, H.

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Nano‐slit probes for near‐field optical microscopy fabricated by focused ion beams von Danzebrink, H. U., Dziomba, TH, Sulzbach, T., Ohlsson, O., Lehrer, C., Frey, L.

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