Bimodal atomic force microscopy imaging of isolated antibodies in air and liquids von Martínez, N F, Lozano, J R, Herruzo, E T, Garcia, F, Richter, C, Sulzbach, T, Garcia, R

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Influence of the cantilever holder on the vibrations of AFM cantilevers von Rabe, U, Hirsekorn, S, Reinstädtler, M, Sulzbach, T, Lehrer, Ch, Arnold, W

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Cantilever probes for high speed AFM von Richter, C., Weinzierl, P., Engl, W., Penzkofer, C., Irmer, B., Sulzbach, T.

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Different types of ferrite thin films as magnetic cantilever coating for magnetic force microscopy von Koblischka, M.R., Kirsch, M., Pfeifer, R., Getlawi, S., Rigato, F., Fontcuberta, J., Sulzbach, T., Hartmann, U.

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Piezoresistive and self-actuated 128-cantilever arrays for nanotechnology applications von Rangelow, I.W., Ivanov, Tzv, Ivanova, K., Volland, B.E., Grabiec, P., Sarov, Y., Persaud, A., Gotszalk, T., Zawierucha, P., Zielony, M., Dontzov, D., Schmidt, B., Zier, M., Nikolov, N., Kostic, I., Engl, W., Sulzbach, T., Mielczarski, J., Kolb, S., Latimier, Du P., Pedreau, R., Djakov, V., Huq, S.E., Edinger, K., Fortagne, O., Almansa, A., Blom, H.O.

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Improvements of the lateral resolution of the MFM technique von Koblischka, M.R., Hartmann, U., Sulzbach, T.

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High-frequency MFM characterization of magnetic recording writer poles von Koblischka, M. R., Wei, J. D., Sulzbach, T., Hartmann, U.

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Preparation of ferrite-coated MFM cantilevers von Koblischka, M.R., Kirsch, M., Wei, J., Sulzbach, T., Hartmann, U.

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Quantum size aspects of the piezoresistive effect in ultra thin piezoresistors von Ivanov, Tzv, Gotszalk, T., Sulzbach, T., Rangelow, I.W.

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Downwards to metrology in nanoscale: determination of the AFM tip shape with well-known sharp-edged calibration structures von H bner, U., Morgenroth, W., Meyer, H.G., Sulzbach, T., Brendel, B., Mirand, W.

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Observation of Stray Fields From Hard-Disk Writer Poles up to 2 GHz von Koblischka, M.R., Wei, J.-D., Sulzbach, T., Johnston, A.D., Hartmann, U.

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Improving the lateral resolution of the MFM technique to the [formula omitted] range von Koblischka, M.R, Hartmann, U, Sulzbach, T

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Advanced Cantilevers for Magnetic Force Microscopy and High Frequency Magnetic Force Microscopy von Koblischka, M. R., Wei, J. D., Richter, C., Sulzbach, T. H., Hartmann, U.

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Search for the optimally suited cantilever type for high-frequency MFM von Koblischka, M R, Wei, J D, Kirsch, M, Lessel, M, Pfeifer, R, Brust, M, Hartmann, U, Richter, C, Sulzbach, T

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AFM cantilever with ultra-thin transistor-channel piezoresistor: quantum confinement von Ivanov, Tzv, Gotszalk, T., Sulzbach, T., Chakarov, I., Rangelow, I.W.

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Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining von Lehrer, C., Frey, L., Petersen, S., Sulzbach, Th, Ohlsson, O., Dziomba, Th, Danzebrink, H.U., Ryssel, H.

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High‐resolution constant‐height imaging with apertured silicon cantilever probes von Dziomba, T., Danzebrink, H. U., Lehrer, C., Frey, L., Sulzbach, T., Ohlsson, O.

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Nano‐slit probes for near‐field optical microscopy fabricated by focused ion beams von Danzebrink, H. U., Dziomba, TH, Sulzbach, T., Ohlsson, O., Lehrer, C., Frey, L.

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Cantilever Based Connector Platform for Exchangeable and Customizable Scanning Probe Tips von Becker, M., Bartenwerfer, M., Eichhorn, V., Krause, O., Sulzbach, T.

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Patterning of permalloy thin films by means of electron-beam lithography and focused ion-beam milling von Getlawi, S., Koblischka, M.R., Hartmann, U., Richter, C., Sulzbach, T.

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