Growth, carcass characteristics, and meat quality of broilers fed a low-energy diet supplemented with a multienzyme preparation von Hussein, E.O.S., Suliman, G.M., Alowaimer, A.N., Ahmed, S.H., Abd El-Hack, M.E., Taha, A.E., Swelum, A.A.

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Effects of stock, sex, and muscle type on carcass characteristics and meat quality attributes of parent broiler breeders and broiler chickens von Hussein, E.O.S., Suliman, G.M., Al-Owaimer, A.N., Ahmed, S.H., Abudabos, A.M., Abd El-Hack, M.E., Taha, A.E., Saadeldin, Islam M., Swelum, A.A.

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Chemical composition and structural characteristics of Arabian camel (Camelus dromedarius) m. longissimus thoracis von Al-Owaimer, A.N., Suliman, G.M., Sami, A.S., Picard, B., Hocquette, J.F.

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Carcass Characteristics and Meat Quality in Four Saudi Camel Breeds von El-Waziry, A.M., Al-Owaimer, A.N., Basmaeil, S., Metwally, H., Suliman, G.M.

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Performance, Carcass Characteristics and Meat Quality of Intact and Castrated Ardhi Goat Kids Fed High Energy Diet von El-Waziry, A.M., Al-Owaimer, A.N., Suliman, G.M., Hussein, E.S., Abouheif, M.A.

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Effects of Feeding Discarded Dates on Growth Performance and Meat Quality Traits of Najdi Lambs von Almitairy, M.H., Alowaimer, A.N., El-Waziry, A.M., Suliman, G.M.

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Gate-oxide grown on the sidewalls and base of a U-shaped Si trench: effects of the oxide and oxide/Si interface condition on the properties of vertical MOS devices von Suliman, S.A., Awadelkarim, O.O., Ridley, R.S., Dolny, G.M.

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Electron and hole trapping in the bulk and interface with Si of a thermal oxide grown on the sidewalls and base of a U-shaped silicon trench von Suliman, S.A., Awadelkarim, O.O., Fonash, S.J., Ridley, R.S., Dolny, G.M., Hao, J., Knoedler, C.M.

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Electrical properties of the gate oxide and its interface with Si in U-shaped trench MOS capacitors: The impact of polycrystalline Si doping and oxide composition von Suliman, S.A., Venkataraman, B., Wu, C.-T., Ridley, R.S., Dolny, G.M., Awadelkarim, O.O., Fonash, S.J., Ruzyllo, J.

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The effects of channel boron-doping on the performance and hot electron reliability of N-channel trench UMOSFETs von Suliman, S.A., Awadelkarim, O.O., Fonash, S.J., Dolny, G.M., Hao, J., Ridley, R.S., Knoedler, C.M.

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