Polarized muon decay: Measurement of the polarization vector of the decay positrons as a test of time reversal invariance von Fetscher, W., Bodek, K., Budzanowski, A., Danneberg, N., Hilbes, C., Jarczyk, L., Kirch, K., Kistryn, S., Klement, J., Köhler, K., Kozela, A., Lang, J., Morelle, X., Schweizer, T., Smyrski, J., Sromicki, J., Stephan, E., Strzak̵owski, A., Zejma, J.

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Simultaneous Measurements of p + d → 3He + π0 and p + d → 3H + π+ Reactions with the GEM detector von Abdel-Samad, S, Bojowald, J, Budzanowski, A, Chatterjee, A, Ernst, J, Frekers, D, Hawranek, P, Ilieva, J, Jarczyk, L, Kilian, K, Kliczewski, A, Klimala, W, Kolev, D, Kravcikova, M, Kutsarova, T, Lieb, J, Machner, H, Magiera, A, Martinska, G, Nann, H, Pentchev, L, Protić, D, von Rossen, P, Roy, B J, Siudak, A, Ulicny, M, Strzakowski, A, Tsenov, R, Urban, J, Zwoll, K

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Surface investigations of ZnBeMnSe mixed crystals by means of the piezoelectric spectroscopy and the AFM technique von STRZALKOWSKI, K, KULESZA, S, ZAKRZEWSKI, J, MALINSKI, M

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States of Matter, States of Mind von Strzakowski, Ireneusz

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Measurements of the Urbach tail for A2B6 mixed crystals by the photothermal method von Zakrzewski, J, Malinski, M, Strzałkowski, K, Firszt, F, Łęgowski, S, Męczyńska, H

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Thermal energy depth of electron traps in the SiO2 layer of the ion-implanted MOS structure von Marczewski, M., Strza⌈kowski, I., Kowalski, M., Dra̧żyk, H.

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