Energy resolution at the Fano limit: The benefits of the principle of sideward depletion for solid state X-ray spectrometry von Schmidt, Julia, Davis, Jeffrey M., Huth, Martin, Hartmann, Robert, Soltau, Heike, Striider, Lothar

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Five Dimensional X-ray Imaging with the Color X-ray Camera von Davis, Jeffrey M., Schmidt, Julia, Huth, Martin, Hartman, Robert, Soltau, Heike, Striider, Lothar

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Advanced 4D STEM Imaging with the pnCCD (S)TEM Camera von Hum, Martin, Simson, Martin, Ritz, Robert, Schmidt, Julia, Soltau, Heike, Yang, Hao, Nellist, Peter, Sagawa, Ryusuke, Kondo, Yukihito, Ryll, Henning, Striider, Lothar

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Setup and Practical Applications of a pnCCD Based XRF System von Davis, Jeffrey M., Schmidt, Julia, Huth, Martin, Ihle, Sebastian, Steigenhofer, Daniel, Holl, Peter, Lutz, Gerhard, Weber, Udo, Niculae, Adrian, Soltau, Heike, Striider, Lothar

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Data analysis for characterizing PNCCDS von Andritschke, Robert, Hartner, Gisela, Hartmann, Robert, Meidinger, Norbert, Struder, Lothar

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Optimized design topologies for position-sensitive Silicon Drift Detectors operating at high drift fields von Castoldi, Andrea, Guazzoni, Chiara, Hartmann, Robert, Struder, Lothar

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