Correlation of thermal-wave imaging to other analysis methods von MAREK, J, STRAUSSER, Y. E

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Power spectral densities: A multiple technique study of different Si wafer surfaces von Marx, Egon, Malik, Igor J., Strausser, Yale E., Bristow, Thomas, Poduje, Noel, Stover, John C.

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Atomic force microscopy enhances chemical mechanical polishing von Strausser, Yale E, Hetherington, Dale L

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Scanning capacitance microscopy for carrier profiling in semiconductors von ERICKSON, A. N, ADDERTON, D. M, STRAUSSER, Y. E, TENCH, R. J

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SCINTILLATION-TYPE ION DETECTOR EMPLOYING A SECONDARY EMITTER TARGET SURROUNDING THE ION PATH von YALE E. STRAUSSER

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Scintillations-Ionendetektor von E. STRAUSSER,YALE

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Auger depth profiling of MNOS structures by ion sputtering von Johannessen, J.S., Helms, C.R., Spicer, W.E., Strausser, Y.E.

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Submicron Auger spectroscopy study of reed contact failures von Majumder, Kumar S., Strausser, Yale E.

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Characterization in Silicon Processing von Strausser, Yale

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Characterization of polycrystalline silicon thin-film multilayers by variable angle spectroscopic ellipsometry von Snyder, Paul G., Xiong, Yi-Ming, Woollam, John A., Krosche, Eric R., Strausser, Yale

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