Treffer 1 - 3 von 3 für Suche 'Stojadinovi, Ninoslav', Suchdauer: 0,39s Treffer weiter einschränken
  1. 1
    Negative bias temperature instability in p-channel power VDMOSFETs: recoverable versus permanent degradation

    Negative bias temperature instability in p-channel power VDMOSFETs: recoverable versus permanent degradation von Dankovi, Danijel, Mani, Ivica, Priji, Aneta, Djori -Veljkovi, Sne ana, Davidovi, Vojkan, Stojadinovi, Ninoslav, Priji, Zoran, Golubovi, Sne ana


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  2. 2
    Effects of consecutive irradiation and bias temperature stress in p-channel power vertical double-diffused metal oxide semiconductor transistors

    Effects of consecutive irradiation and bias temperature stress in p-channel power vertical double-diffused metal oxide semiconductor transistors von Davidovi, Vojkan, Dankovi, Danijel, Ili, Aleksandar, Mani, Ivica, Golubovi, Sne ana, Djori -Veljkovi, Sne ana, Priji, Zoran, Priji, Aneta, Stojadinovi, Ninoslav


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  3. 3
    Annealing influence on recovery of electrically stressed power vertical double-diffused metal oxide semiconductor transistors

    Annealing influence on recovery of electrically stressed power vertical double-diffused metal oxide semiconductor transistors von Djori -Veljkovi, Sne ana, Mani, Ivica, Davidovi, Vojkan, Dankovi, Danijel, Golubovi, Sne ana, Stojadinovi, Ninoslav


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